{"title":"基于特征的模拟电路状态空间覆盖","authors":"Andreas Furtig, S. Steinhorst, L. Hedrich","doi":"10.1109/FDL.2016.7880388","DOIUrl":null,"url":null,"abstract":"This paper proposes a systematic and fast analog coverage-driven verification methodology which could increase the confidence in verification of today’s analog blocks. We define an appropriate coverage metric to score simulations and then minimize the simulation effort for achieving full state space coverage with an algorithm generating appropriate input stimuli. Our proposed method uses characteristic properties of a discretized representation of the state space such as the spatial distribution of eigenvalues, guiding the generation of short and purposeful stimuli. The experimental results show a significant speed-up with similar accuracy compared to the state-of-the-art.","PeriodicalId":137305,"journal":{"name":"2016 Forum on Specification and Design Languages (FDL)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Feature based state space coverage of analog circuits\",\"authors\":\"Andreas Furtig, S. Steinhorst, L. Hedrich\",\"doi\":\"10.1109/FDL.2016.7880388\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a systematic and fast analog coverage-driven verification methodology which could increase the confidence in verification of today’s analog blocks. We define an appropriate coverage metric to score simulations and then minimize the simulation effort for achieving full state space coverage with an algorithm generating appropriate input stimuli. Our proposed method uses characteristic properties of a discretized representation of the state space such as the spatial distribution of eigenvalues, guiding the generation of short and purposeful stimuli. The experimental results show a significant speed-up with similar accuracy compared to the state-of-the-art.\",\"PeriodicalId\":137305,\"journal\":{\"name\":\"2016 Forum on Specification and Design Languages (FDL)\",\"volume\":\"86 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 Forum on Specification and Design Languages (FDL)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FDL.2016.7880388\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Forum on Specification and Design Languages (FDL)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FDL.2016.7880388","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Feature based state space coverage of analog circuits
This paper proposes a systematic and fast analog coverage-driven verification methodology which could increase the confidence in verification of today’s analog blocks. We define an appropriate coverage metric to score simulations and then minimize the simulation effort for achieving full state space coverage with an algorithm generating appropriate input stimuli. Our proposed method uses characteristic properties of a discretized representation of the state space such as the spatial distribution of eigenvalues, guiding the generation of short and purposeful stimuli. The experimental results show a significant speed-up with similar accuracy compared to the state-of-the-art.