A. Saldanha, R. Brayton, A. Sangiovanni-Vincentelli, K. Cheng
{"title":"考虑可测试性的时序优化","authors":"A. Saldanha, R. Brayton, A. Sangiovanni-Vincentelli, K. Cheng","doi":"10.1109/ICCAD.1990.129953","DOIUrl":null,"url":null,"abstract":"Since redundancy is undesirable in high performance circuits, the authors explore timing optimization procedures to determine whether performance optimization may be achieved without introducing redundancy. They demonstrate the conditions under which timing optimization may introduce single stuck-fault redundancies into a given irredundant circuit and illustrate the difficulties in removing or preventing these redundancies. The authors then resolve the question of whether a testability criterion exists that may be retained or easily maintained as invariant during timing resynthesis.<<ETX>>","PeriodicalId":242666,"journal":{"name":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","volume":"387 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Timing optimization with testability considerations\",\"authors\":\"A. Saldanha, R. Brayton, A. Sangiovanni-Vincentelli, K. Cheng\",\"doi\":\"10.1109/ICCAD.1990.129953\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Since redundancy is undesirable in high performance circuits, the authors explore timing optimization procedures to determine whether performance optimization may be achieved without introducing redundancy. They demonstrate the conditions under which timing optimization may introduce single stuck-fault redundancies into a given irredundant circuit and illustrate the difficulties in removing or preventing these redundancies. The authors then resolve the question of whether a testability criterion exists that may be retained or easily maintained as invariant during timing resynthesis.<<ETX>>\",\"PeriodicalId\":242666,\"journal\":{\"name\":\"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers\",\"volume\":\"387 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-11-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.1990.129953\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1990.129953","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Timing optimization with testability considerations
Since redundancy is undesirable in high performance circuits, the authors explore timing optimization procedures to determine whether performance optimization may be achieved without introducing redundancy. They demonstrate the conditions under which timing optimization may introduce single stuck-fault redundancies into a given irredundant circuit and illustrate the difficulties in removing or preventing these redundancies. The authors then resolve the question of whether a testability criterion exists that may be retained or easily maintained as invariant during timing resynthesis.<>