考虑可测试性的时序优化

A. Saldanha, R. Brayton, A. Sangiovanni-Vincentelli, K. Cheng
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引用次数: 9

摘要

由于冗余在高性能电路中是不希望的,作者探索时序优化程序,以确定是否可以在不引入冗余的情况下实现性能优化。他们演示了时序优化可能在给定的非冗余电路中引入单个卡故障冗余的条件,并说明了消除或防止这些冗余的困难。然后,作者解决了是否存在可测试性准则的问题,该准则可以在定时再合成期间保留或容易地保持不变。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Timing optimization with testability considerations
Since redundancy is undesirable in high performance circuits, the authors explore timing optimization procedures to determine whether performance optimization may be achieved without introducing redundancy. They demonstrate the conditions under which timing optimization may introduce single stuck-fault redundancies into a given irredundant circuit and illustrate the difficulties in removing or preventing these redundancies. The authors then resolve the question of whether a testability criterion exists that may be retained or easily maintained as invariant during timing resynthesis.<>
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