V. Meyssen, P. Stolk, J. van Zijl, J. van Berkum, W.G. van der Wijgert
{"title":"利用锗预非晶化和尖峰退火优化深亚微米CMOS的浅结","authors":"V. Meyssen, P. Stolk, J. van Zijl, J. van Berkum, W.G. van der Wijgert","doi":"10.1109/ESSDERC.2000.194798","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":354721,"journal":{"name":"30th European Solid-State Device Research Conference","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Using Ge pre-amorphisation and spike annealing for optimizing shallow junctions in deep-submicron CMOS\",\"authors\":\"V. Meyssen, P. Stolk, J. van Zijl, J. van Berkum, W.G. van der Wijgert\",\"doi\":\"10.1109/ESSDERC.2000.194798\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":354721,\"journal\":{\"name\":\"30th European Solid-State Device Research Conference\",\"volume\":\"90 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"30th European Solid-State Device Research Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSDERC.2000.194798\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"30th European Solid-State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2000.194798","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}