用瞬态响应分析进行线性电路的功能测试

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI:10.1109/DFTVS.1993.595825

D. Taylor, P. Evans, D. Marland

{"title":"用瞬态响应分析进行线性电路的功能测试","authors":"D. Taylor, P. Evans, D. Marland","doi":"10.1109/DFTVS.1993.595825","DOIUrl":null,"url":null,"abstract":"The impulse response of a linear circuit element contains enough information to functionally characterize that element. A numerical technique for the comparison of observed and expected (reference) transient responses is presented. The application of this technique results in an index, which is an absolute measure of device functionality, and real-time pass/fail limits are then set by simulating functional defects in the device under test and noting the magnitude of the indices generated. Comparisons of transient response test results with the results obtained from conventional test programs are presented for D/A converters.","PeriodicalId":213798,"journal":{"name":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Functional testing of linear circuits using transient response analysis\",\"authors\":\"D. Taylor, P. Evans, D. Marland\",\"doi\":\"10.1109/DFTVS.1993.595825\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The impulse response of a linear circuit element contains enough information to functionally characterize that element. A numerical technique for the comparison of observed and expected (reference) transient responses is presented. The application of this technique results in an index, which is an absolute measure of device functionality, and real-time pass/fail limits are then set by simulating functional defects in the device under test and noting the magnitude of the indices generated. Comparisons of transient response test results with the results obtained from conventional test programs are presented for D/A converters.\",\"PeriodicalId\":213798,\"journal\":{\"name\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1993.595825\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1993.595825","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

线性电路元件的脉冲响应包含足够的信息来描述该元件的功能特征。提出了一种比较观测和期望(参考)瞬态响应的数值方法。该技术的应用产生了一个指数，这是设备功能的绝对度量，然后通过模拟被测设备中的功能缺陷并注意生成的指数的大小来设置实时合格/不合格限制。对D/A变换器的暂态响应测试结果与常规测试程序的结果进行了比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Functional testing of linear circuits using transient response analysis

The impulse response of a linear circuit element contains enough information to functionally characterize that element. A numerical technique for the comparison of observed and expected (reference) transient responses is presented. The application of this technique results in an index, which is an absolute measure of device functionality, and real-time pass/fail limits are then set by simulating functional defects in the device under test and noting the magnitude of the indices generated. Comparisons of transient response test results with the results obtained from conventional test programs are presented for D/A converters.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

自引率

0.00%

发文量