辐射环境下电路TMR保护的验证与优化

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2011-04-13 DOI:10.1109/DDECS.2011.5783120

Ó. Ruano, J. A. Maestro, P. Reviriego

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引用次数: 1

摘要

提出了一种基于优化过程和软件故障注入的方法来验证和改进针对seu的TMR保护。它允许验证保护实现的可靠性，优化解决方案区域成本。

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Validation and optimization of TMR protections for circuits in radiation environments

A methodology based on optimization processes and software fault injection is presented to verify and improve TMR protection against SEUs. It allows validating the reliability achieved by the protection, optimizing the solution area cost.

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来源期刊

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems

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