{"title":"一个完全合格的模拟设计流程的非易失性存储器技术","authors":"P. Daglio, M. Araldi, M. Morbarigazzi, C. Roma","doi":"10.1109/ISQED.2001.915270","DOIUrl":null,"url":null,"abstract":"The wide range and rapid increase in the complexity of CAD tools demands proven and safe design flows. This paper presents a fully validated methodology integrated as analog design flow to design nonvolatile memories. Specifically, it has been applied to designs in 0.35 mm EEPROM and 0.13 um flash memory processes developed in the company. The remarkable feature of the proposed methodology is the excellent integration between CAD tools released by different vendors and internally developed solutions. Furthermore we show a flow which provides full compatibility and flexibility among analog design steps that could cut down time-to-design, time-to-market and streamline the design quality, thus enhancing the circuit yield and robustness.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"127 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A fully qualified analog design flow for nonvolatile memories technologies\",\"authors\":\"P. Daglio, M. Araldi, M. Morbarigazzi, C. Roma\",\"doi\":\"10.1109/ISQED.2001.915270\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The wide range and rapid increase in the complexity of CAD tools demands proven and safe design flows. This paper presents a fully validated methodology integrated as analog design flow to design nonvolatile memories. Specifically, it has been applied to designs in 0.35 mm EEPROM and 0.13 um flash memory processes developed in the company. The remarkable feature of the proposed methodology is the excellent integration between CAD tools released by different vendors and internally developed solutions. Furthermore we show a flow which provides full compatibility and flexibility among analog design steps that could cut down time-to-design, time-to-market and streamline the design quality, thus enhancing the circuit yield and robustness.\",\"PeriodicalId\":110117,\"journal\":{\"name\":\"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design\",\"volume\":\"127 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-03-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2001.915270\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2001.915270","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
CAD工具的广泛和复杂性的快速增加需要经过验证和安全的设计流程。本文提出了一种完全验证的方法,集成为模拟设计流程来设计非易失性存储器。具体而言,它已应用于该公司开发的0.35 mm EEPROM和0.13 um闪存工艺的设计。所提出的方法的显著特征是不同供应商发布的CAD工具和内部开发的解决方案之间的出色集成。此外,我们展示了在模拟设计步骤之间提供完全兼容性和灵活性的流程,可以缩短设计时间,上市时间并简化设计质量,从而提高电路良率和稳健性。
A fully qualified analog design flow for nonvolatile memories technologies
The wide range and rapid increase in the complexity of CAD tools demands proven and safe design flows. This paper presents a fully validated methodology integrated as analog design flow to design nonvolatile memories. Specifically, it has been applied to designs in 0.35 mm EEPROM and 0.13 um flash memory processes developed in the company. The remarkable feature of the proposed methodology is the excellent integration between CAD tools released by different vendors and internally developed solutions. Furthermore we show a flow which provides full compatibility and flexibility among analog design steps that could cut down time-to-design, time-to-market and streamline the design quality, thus enhancing the circuit yield and robustness.