{"title":"交点STT-MRAM阵列读写操作的可变性感知分析与设计指南","authors":"Y. A. Belay, A. Cabrini, G. Torelli","doi":"10.1109/PRIME.2018.8430358","DOIUrl":null,"url":null,"abstract":"Beneliting from emerging resistance-switching mem- ory technologies, crosspoint array has become an attractive array architecture to obtain high storage density. Among the emerging technologies, Spin-Transfer Torque magnetic memory (STT-MRAM) is a potential candidate as storage class memory (SCM) or static/dynamic RAM replacement due to its high write speed, scalability and other interesting characteristics. In this paper, we present a variation-aware comprehensive analysis of the boundary conditions for write and read requirements for the implementation of crosspoint STT-MRAM Arrays. The results of the analysis are very useful as design guide and for choosing a suitable selector device for Crosspoint STT-MRAM arrays.","PeriodicalId":384458,"journal":{"name":"2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Variability-Aware Analysis and Design Guideline for Write and Read Operations in Crosspoint STT-MRAM Arrays\",\"authors\":\"Y. A. Belay, A. Cabrini, G. Torelli\",\"doi\":\"10.1109/PRIME.2018.8430358\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Beneliting from emerging resistance-switching mem- ory technologies, crosspoint array has become an attractive array architecture to obtain high storage density. Among the emerging technologies, Spin-Transfer Torque magnetic memory (STT-MRAM) is a potential candidate as storage class memory (SCM) or static/dynamic RAM replacement due to its high write speed, scalability and other interesting characteristics. In this paper, we present a variation-aware comprehensive analysis of the boundary conditions for write and read requirements for the implementation of crosspoint STT-MRAM Arrays. The results of the analysis are very useful as design guide and for choosing a suitable selector device for Crosspoint STT-MRAM arrays.\",\"PeriodicalId\":384458,\"journal\":{\"name\":\"2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)\",\"volume\":\"96 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PRIME.2018.8430358\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PRIME.2018.8430358","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Variability-Aware Analysis and Design Guideline for Write and Read Operations in Crosspoint STT-MRAM Arrays
Beneliting from emerging resistance-switching mem- ory technologies, crosspoint array has become an attractive array architecture to obtain high storage density. Among the emerging technologies, Spin-Transfer Torque magnetic memory (STT-MRAM) is a potential candidate as storage class memory (SCM) or static/dynamic RAM replacement due to its high write speed, scalability and other interesting characteristics. In this paper, we present a variation-aware comprehensive analysis of the boundary conditions for write and read requirements for the implementation of crosspoint STT-MRAM Arrays. The results of the analysis are very useful as design guide and for choosing a suitable selector device for Crosspoint STT-MRAM arrays.