参数变化及其对电路和微结构的影响

Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI:10.1145/775832.775920

S. Borkar, T. Karnik, S. Narendra, J. Tschanz, A. Keshavarzi, V. De

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引用次数: 1526

摘要

超90纳米工艺参数的变化将对未来高性能微处理器的设计构成重大挑战。在本文中，我们讨论了工艺、电压和温度的变化;以及它们对电路和微架构的影响。还提出了可能的解决方案，以减少参数变化的影响，并实现更高的频率箱。

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Parameter variations and impact on circuits and microarchitecture

Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.

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Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)

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