{"title":"基于EDA的BIT虚警自动仿真方法","authors":"Junyou Shi, Jin-zhong Li, Meng Shi","doi":"10.1109/ICIEA.2011.5975817","DOIUrl":null,"url":null,"abstract":"The principle of built-in test false alarm simulation (BFAS) is analyzed, with the definition of BFAS in this paper. Related false alarm inducing factors simulated by electronic design automation (EDA) techniques are determined, including load variations, power supply disturbances and electromagnetic interferences. The concept of false alarm simulation profile is proposed. The types and simulation modes of false alarm inducing events are analyzed. The automated insertion algorithm of false alarm inducing events and the flow of BFAS are established, and verified using a typical circuit. It is shown that this method is feasible and effective, and can be used to analyze false alarms in the development stage.","PeriodicalId":304500,"journal":{"name":"2011 6th IEEE Conference on Industrial Electronics and Applications","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Method of automated BIT false alarms simulation based on EDA\",\"authors\":\"Junyou Shi, Jin-zhong Li, Meng Shi\",\"doi\":\"10.1109/ICIEA.2011.5975817\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The principle of built-in test false alarm simulation (BFAS) is analyzed, with the definition of BFAS in this paper. Related false alarm inducing factors simulated by electronic design automation (EDA) techniques are determined, including load variations, power supply disturbances and electromagnetic interferences. The concept of false alarm simulation profile is proposed. The types and simulation modes of false alarm inducing events are analyzed. The automated insertion algorithm of false alarm inducing events and the flow of BFAS are established, and verified using a typical circuit. It is shown that this method is feasible and effective, and can be used to analyze false alarms in the development stage.\",\"PeriodicalId\":304500,\"journal\":{\"name\":\"2011 6th IEEE Conference on Industrial Electronics and Applications\",\"volume\":\"68 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 6th IEEE Conference on Industrial Electronics and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIEA.2011.5975817\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 6th IEEE Conference on Industrial Electronics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIEA.2011.5975817","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Method of automated BIT false alarms simulation based on EDA
The principle of built-in test false alarm simulation (BFAS) is analyzed, with the definition of BFAS in this paper. Related false alarm inducing factors simulated by electronic design automation (EDA) techniques are determined, including load variations, power supply disturbances and electromagnetic interferences. The concept of false alarm simulation profile is proposed. The types and simulation modes of false alarm inducing events are analyzed. The automated insertion algorithm of false alarm inducing events and the flow of BFAS are established, and verified using a typical circuit. It is shown that this method is feasible and effective, and can be used to analyze false alarms in the development stage.
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