用于模拟电路内置自检的原型单元

Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300) Pub Date : 1999-03-25 DOI:10.1109/SECON.1999.766128

B. Lewis, S. Lim, R. Puckett, C. Stroud

{"title":"用于模拟电路内置自检的原型单元","authors":"B. Lewis, S. Lim, R. Puckett, C. Stroud","doi":"10.1109/SECON.1999.766128","DOIUrl":null,"url":null,"abstract":"The design, implementation, and operation of a prototype assembly used to evaluate and demonstrate a mixed-signal based built-in self-test approach for analog circuits is described. Experimental results obtained from testing benchmark circuits using the prototype assembly are presented to illustrate results that cannot be easily obtained from a simulation environment.","PeriodicalId":126922,"journal":{"name":"Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300)","volume":"461 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-03-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A prototype unit for built-in self-test of analog circuits\",\"authors\":\"B. Lewis, S. Lim, R. Puckett, C. Stroud\",\"doi\":\"10.1109/SECON.1999.766128\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The design, implementation, and operation of a prototype assembly used to evaluate and demonstrate a mixed-signal based built-in self-test approach for analog circuits is described. Experimental results obtained from testing benchmark circuits using the prototype assembly are presented to illustrate results that cannot be easily obtained from a simulation environment.\",\"PeriodicalId\":126922,\"journal\":{\"name\":\"Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300)\",\"volume\":\"461 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-03-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SECON.1999.766128\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.1999.766128","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

描述了用于评估和演示基于混合信号的模拟电路内置自检方法的原型组件的设计，实现和操作。本文给出了使用原型组件测试基准电路的实验结果，以说明在仿真环境中不易获得的结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A prototype unit for built-in self-test of analog circuits

The design, implementation, and operation of a prototype assembly used to evaluate and demonstrate a mixed-signal based built-in self-test approach for analog circuits is described. Experimental results obtained from testing benchmark circuits using the prototype assembly are presented to illustrate results that cannot be easily obtained from a simulation environment.

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Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300)

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