一种减少高速闪存adc中气泡和亚稳态误差的新ROM结构

Mustafijur Rahman, K. L. Baishnab, F. Talukdar
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引用次数: 31

摘要

在闪存ADC中,比较器的输出构成温度计代码。在温度计到二进制解码器的帮助下,使用ROM将该温度计代码转换为二进制代码。然而,这种转换方案存在亚稳态和气泡误差。提出了一种新的ROM结构,可以抑制亚稳态、一阶和二阶气泡误差。它消除了在ROM前端的纠错电路的需要,从而降低了功耗,面积要求并消除了与附加级相关的延迟。这种结构也消除了对格雷编码ROM和格雷二进制转换器的需要,从而使电路更简单。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel ROM architecture for reducing bubble and metastability errors in high speed flash ADCs
In a flash ADC, output of the comparators constitute the thermometer code. This thermometer code is converted to binary code with the help of a thermometer to binary decoder using a ROM. However, this conversion scheme suffers from metastability and bubble errors. A novel ROM architecture has been proposed which suppresses metastability, both first and second order bubble errors. It eliminates the need of an error correction circuit in the front end of the ROM thereby reducing power consumption, area requirement and removing the delay associated with the additional stage. This architecture also eliminates the need of Gray coded ROM and Gray to binary converter thereby making the circuit simpler.
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