AMS-RF测试质量:评估缺陷严重程度。

2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) Pub Date : 2018-07-01 DOI:10.1109/IOLTS.2018.8474109

Valentin Guiterrez, A. Ginés, G. Léger

{"title":"AMS-RF测试质量:评估缺陷严重程度。","authors":"Valentin Guiterrez, A. Ginés, G. Léger","doi":"10.1109/IOLTS.2018.8474109","DOIUrl":null,"url":null,"abstract":"In safety critical applications there is a demand for estimating defect coverage in order to meet stringent quality levels. However, defect simulation of complex AMS-RF circuits is computationally expensive since achieving good confidence interval requires sampling many defects. In this paper, we show on a practical case of study that it may be beneficial to complement defect coverage with fault coverage and assess the severity of defect escapes to get a complete picture of test quality.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"AMS-RF test quality: Assessing defect severity.\",\"authors\":\"Valentin Guiterrez, A. Ginés, G. Léger\",\"doi\":\"10.1109/IOLTS.2018.8474109\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In safety critical applications there is a demand for estimating defect coverage in order to meet stringent quality levels. However, defect simulation of complex AMS-RF circuits is computationally expensive since achieving good confidence interval requires sampling many defects. In this paper, we show on a practical case of study that it may be beneficial to complement defect coverage with fault coverage and assess the severity of defect escapes to get a complete picture of test quality.\",\"PeriodicalId\":241735,\"journal\":{\"name\":\"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)\",\"volume\":\"96 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2018.8474109\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2018.8474109","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

在安全关键应用中，为了满足严格的质量标准，需要估计缺陷覆盖范围。然而，复杂AMS-RF电路的缺陷模拟计算成本很高，因为要获得良好的置信区间需要对许多缺陷进行采样。在本文中，我们展示了一个实际的研究案例，它可能有利于用错误覆盖来补充缺陷覆盖，并评估缺陷逃逸的严重程度，以获得测试质量的完整图像。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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AMS-RF test quality: Assessing defect severity.

In safety critical applications there is a demand for estimating defect coverage in order to meet stringent quality levels. However, defect simulation of complex AMS-RF circuits is computationally expensive since achieving good confidence interval requires sampling many defects. In this paper, we show on a practical case of study that it may be beneficial to complement defect coverage with fault coverage and assess the severity of defect escapes to get a complete picture of test quality.

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来源期刊

2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)

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