芯片级板和mcm的自动测试性分析

Proceedings Sixth Asian Test Symposium (ATS'97) Pub Date : 1997-11-17 DOI:10.1109/ATS.1997.643913

Marc Perbost, L. Lan, C. Landrault

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引用次数: 0

摘要

最小化电路板和mcm的测试成本意味着除了使用测试标准(IEEE 1149)之外，还要投资于可测试性分析。本文提出了一种针对达索电子公司设计的电路板和单片机的可测试性分析方法。根据这种新方法实现的实际原型旨在帮助可测试性专家。

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Automatic testability analysis of boards and MCMs at chip level

Minimising the testing costs of boards and MCMs implies to invest in testability analysis in addition to the use of testing standards (IEEE 1149). In this paper, we propose a testability analysis method for boards and MCMs designed at Dassault Electronique. The actual prototype realised according to this new methodology aims at helping testability expert.

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Proceedings Sixth Asian Test Symposium (ATS'97)

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