E.S. Makhinov, A. Egorov, I. Loskutov, P. V. Nekrasov
{"title":"STM32单片机SEFI截面测定的程序注入方法研究","authors":"E.S. Makhinov, A. Egorov, I. Loskutov, P. V. Nekrasov","doi":"10.1109/MWENT55238.2022.9802291","DOIUrl":null,"url":null,"abstract":"The program injection method is an applied solution to the problem determining the Single Event Function Interrupt (SEFI) cross section of MCU for any program used. Each program is characterized by its number of critical bits. Under the influence of single ionzing particles on these memory bits a SEFI occurs. The program injection method allows studying crititcal bits of the program while using only accessible to the programmer memory areas. Bits that are not available for direct study by the method are located in a protected area of the memory and the core of the MCU. To take them into account, it is necessary to know the dependence of the SEFI cross section on the number of critical bits.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"28 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Research of the Program Injection Method for Determing the SEFI Cross Section of STM32 Microcontroller\",\"authors\":\"E.S. Makhinov, A. Egorov, I. Loskutov, P. V. Nekrasov\",\"doi\":\"10.1109/MWENT55238.2022.9802291\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The program injection method is an applied solution to the problem determining the Single Event Function Interrupt (SEFI) cross section of MCU for any program used. Each program is characterized by its number of critical bits. Under the influence of single ionzing particles on these memory bits a SEFI occurs. The program injection method allows studying crititcal bits of the program while using only accessible to the programmer memory areas. Bits that are not available for direct study by the method are located in a protected area of the memory and the core of the MCU. To take them into account, it is necessary to know the dependence of the SEFI cross section on the number of critical bits.\",\"PeriodicalId\":218866,\"journal\":{\"name\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"volume\":\"28 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWENT55238.2022.9802291\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWENT55238.2022.9802291","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Research of the Program Injection Method for Determing the SEFI Cross Section of STM32 Microcontroller
The program injection method is an applied solution to the problem determining the Single Event Function Interrupt (SEFI) cross section of MCU for any program used. Each program is characterized by its number of critical bits. Under the influence of single ionzing particles on these memory bits a SEFI occurs. The program injection method allows studying crititcal bits of the program while using only accessible to the programmer memory areas. Bits that are not available for direct study by the method are located in a protected area of the memory and the core of the MCU. To take them into account, it is necessary to know the dependence of the SEFI cross section on the number of critical bits.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
