高可靠性双层电容器的设计与性能

40th Conference Proceedings on Electronic Components and Technology Pub Date : 1990-05-20 DOI:10.1109/ECTC.1990.122204

J. Miller, D. Evans

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引用次数: 5

摘要

开发，测试和使用高可靠的双层电容器组件设计在-55度至85摄氏度的范围内运行描述。该组件采用创新设计的焊接钽封装，使用寿命长，电气性能稳定。设计的细节与寿命和压力测试数据一起呈现。讨论了其独特的特性，并描述了简单的等效电路模型，以帮助应用工程师优化使用该元件。试验结果表明:(1)>在85℃、额定电压下寿命2000-h;(2) 85℃时，> 20000个浪涌电流循环;(3)在85℃125%电压应力条件下，>1000 h寿命;(4)在95℃温度应力条件下，工作寿命为700h

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Design and performance of high-reliability double-layer capacitors

The development, testing, and use of a highly reliable double-layer capacitor component designed for operation in the range of -55 degrees to 85 degrees C are described. This component offers a welded tantalum package with an innovative design to provide long life with stable electrical performance. Details of the design are presented along with life- and stress-test data. Unique characteristics are discussed and simple equivalent circuit models are described to assist application engineers in the optimal use of this component. Test results show the following: (1) >2000-h life at 85 degrees C and rated voltage; (2) > 20000 surge current cycles at 85 degrees C; (3) >1000-h life at 85 degrees C under 125% voltage stress conditions; and (4) >700-h operating life at 95 degrees C temperature stress conditions.<>

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来源期刊

40th Conference Proceedings on Electronic Components and Technology

CiteScore

3.10

自引率

0.00%

发文量