A. Mirchandani, N. Thapar, T. Boden, R. Sodhi, D. Kinzer
{"title":"一种新颖的n沟道MOSFET,具有集成肖特基和无内部pn结","authors":"A. Mirchandani, N. Thapar, T. Boden, R. Sodhi, D. Kinzer","doi":"10.1109/WCT.2004.240292","DOIUrl":null,"url":null,"abstract":"This paper presents a new MOSFET structure with an integrated Schottky junction in every unit cell and with no p-n junction in the current flow path. This eliminates the injected reverse recovery charge while providing a low forward voltage drop anti-parallel Schottky diode. Gate controlled current conduction in the on-state takes place through an accumulated channel region formed along the trench sidewall. A specific on-resistance of 10.6 m/spl Omega/-mm/sup 2/ and 7.6 m/spl Omega/-mm/sup 2/ for a gate bias of 4.5 V and 10V respectively has been achieved, with a forward blocking voltage of over 30 V. This coupled with no reverse recovery charge makes the device very suitable for high frequency DC-DC converter applications.","PeriodicalId":303825,"journal":{"name":"2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A novel n-channel MOSFET featuring an integrated Schottky and no internal p-n junction\",\"authors\":\"A. Mirchandani, N. Thapar, T. Boden, R. Sodhi, D. Kinzer\",\"doi\":\"10.1109/WCT.2004.240292\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new MOSFET structure with an integrated Schottky junction in every unit cell and with no p-n junction in the current flow path. This eliminates the injected reverse recovery charge while providing a low forward voltage drop anti-parallel Schottky diode. Gate controlled current conduction in the on-state takes place through an accumulated channel region formed along the trench sidewall. A specific on-resistance of 10.6 m/spl Omega/-mm/sup 2/ and 7.6 m/spl Omega/-mm/sup 2/ for a gate bias of 4.5 V and 10V respectively has been achieved, with a forward blocking voltage of over 30 V. This coupled with no reverse recovery charge makes the device very suitable for high frequency DC-DC converter applications.\",\"PeriodicalId\":303825,\"journal\":{\"name\":\"2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WCT.2004.240292\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WCT.2004.240292","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel n-channel MOSFET featuring an integrated Schottky and no internal p-n junction
This paper presents a new MOSFET structure with an integrated Schottky junction in every unit cell and with no p-n junction in the current flow path. This eliminates the injected reverse recovery charge while providing a low forward voltage drop anti-parallel Schottky diode. Gate controlled current conduction in the on-state takes place through an accumulated channel region formed along the trench sidewall. A specific on-resistance of 10.6 m/spl Omega/-mm/sup 2/ and 7.6 m/spl Omega/-mm/sup 2/ for a gate bias of 4.5 V and 10V respectively has been achieved, with a forward blocking voltage of over 30 V. This coupled with no reverse recovery charge makes the device very suitable for high frequency DC-DC converter applications.