使用插值抖动过采样的1ps分辨率抖动测量宏

2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers Pub Date : 2006-09-18 DOI:10.1109/ISSCC.2006.1696271

K. Nose, M. Kajita, M. Mizuno

{"title":"使用插值抖动过采样的1ps分辨率抖动测量宏","authors":"K. Nose, M. Kajita, M. Mizuno","doi":"10.1109/ISSCC.2006.1696271","DOIUrl":null,"url":null,"abstract":"An in-field real-time successive jitter-measurement macro is developed. It features interpolated jitter oversampling and feedforward calibration that help attain 1ps resolution and a hierarchical Vernier jitter-measurement technique that exploits the trade-off between rms and deterministic jitter measurement characteristics","PeriodicalId":166617,"journal":{"name":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"66","resultStr":"{\"title\":\"A 1ps-Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversampling\",\"authors\":\"K. Nose, M. Kajita, M. Mizuno\",\"doi\":\"10.1109/ISSCC.2006.1696271\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An in-field real-time successive jitter-measurement macro is developed. It features interpolated jitter oversampling and feedforward calibration that help attain 1ps resolution and a hierarchical Vernier jitter-measurement technique that exploits the trade-off between rms and deterministic jitter measurement characteristics\",\"PeriodicalId\":166617,\"journal\":{\"name\":\"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"66\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2006.1696271\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2006.1696271","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 66

摘要

开发了现场实时连续抖动测量宏。它具有内插抖动过采样和前馈校准，有助于获得1ps分辨率和分层游标抖动测量技术，利用有效值和确定性抖动测量特性之间的权衡

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

A 1ps-Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversampling

An in-field real-time successive jitter-measurement macro is developed. It features interpolated jitter oversampling and feedforward calibration that help attain 1ps resolution and a hierarchical Vernier jitter-measurement technique that exploits the trade-off between rms and deterministic jitter measurement characteristics

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers

自引率

0.00%

发文量