{"title":"Buck转换器在SystemVerilog中的建模,用于验证和虚拟测试应用","authors":"Elvis Shera, C. Wegener","doi":"10.1109/IMS3TW.2015.7177865","DOIUrl":null,"url":null,"abstract":"Functional verification and Virtual Test, which is verification of a test procedure, of mixed-signal circuits share the need for efficient simulation capabilities. Switching DC/DC converters are a particularly hard problem, because traditional SPICE-type simulation approaches incur simulation efforts which prevent one from covering all conceivable use-cases. The new IEEE 1800-2012 standard for SystemVerilog (SV) introduces the concepts of user-defined data types (UDT) and user defined resolution functions (UDR) which allows for easier modeling of the loading effects. Such improvementes together with the high performance of an event-driven simulator increase the capability of SystemVerilog in supporting efficient, fast to simulate and yet accurate models of mixed-signal circuits. In this contribution, we propose a block-level modeling strategy which considers the loading effects caused by either subsequent blocks in the signal path or by faults assumed in the circuit.","PeriodicalId":370144,"journal":{"name":"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Buck converter modeling in SystemVerilog for verification and virtual test applications\",\"authors\":\"Elvis Shera, C. Wegener\",\"doi\":\"10.1109/IMS3TW.2015.7177865\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Functional verification and Virtual Test, which is verification of a test procedure, of mixed-signal circuits share the need for efficient simulation capabilities. Switching DC/DC converters are a particularly hard problem, because traditional SPICE-type simulation approaches incur simulation efforts which prevent one from covering all conceivable use-cases. The new IEEE 1800-2012 standard for SystemVerilog (SV) introduces the concepts of user-defined data types (UDT) and user defined resolution functions (UDR) which allows for easier modeling of the loading effects. Such improvementes together with the high performance of an event-driven simulator increase the capability of SystemVerilog in supporting efficient, fast to simulate and yet accurate models of mixed-signal circuits. In this contribution, we propose a block-level modeling strategy which considers the loading effects caused by either subsequent blocks in the signal path or by faults assumed in the circuit.\",\"PeriodicalId\":370144,\"journal\":{\"name\":\"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMS3TW.2015.7177865\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS3TW.2015.7177865","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Buck converter modeling in SystemVerilog for verification and virtual test applications
Functional verification and Virtual Test, which is verification of a test procedure, of mixed-signal circuits share the need for efficient simulation capabilities. Switching DC/DC converters are a particularly hard problem, because traditional SPICE-type simulation approaches incur simulation efforts which prevent one from covering all conceivable use-cases. The new IEEE 1800-2012 standard for SystemVerilog (SV) introduces the concepts of user-defined data types (UDT) and user defined resolution functions (UDR) which allows for easier modeling of the loading effects. Such improvementes together with the high performance of an event-driven simulator increase the capability of SystemVerilog in supporting efficient, fast to simulate and yet accurate models of mixed-signal circuits. In this contribution, we propose a block-level modeling strategy which considers the loading effects caused by either subsequent blocks in the signal path or by faults assumed in the circuit.