图描述方法在超大规模集成电路结构与电学分析中的应用

International Symposium on Semiconductor Manufacturing, Extended Abstracts of ISSM Pub Date : 1994-06-21 DOI:10.1109/ISSM.1994.729463

Katsuyuki Ochiai, S. Tazawa, S. Nakajima

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引用次数: 0

摘要

提出了一种图形描述方法来描述布局模式数据。图形不仅可以表示模式的位置，还可以表示模式的物理属性。因此，大规模集成电路结构识别的数据处理时间比直接处理顶点坐标模式数据的方法要短。

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Application Of A Graph Description Method For Structural And Electrical Analysis Of VLSIs

A graph description method is proposed to describe layout pattern data. The Graph can express not only pattern positions but also physical attributes of the patterns. Therefore, the data processing time for structural recognition of LSI is less than a method dealing with pattern data of vertex coordinates directly.

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International Symposium on Semiconductor Manufacturing, Extended Abstracts of ISSM

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