一种计算闪存冗余覆盖率的方法

Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing Pub Date : 2001-08-06 DOI:10.1109/MTDT.2001.945226

S. Matarrese, L. Fasoli

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引用次数: 5

摘要

提出了一种计算FLASH存储器冗余覆盖率的方法。该方法可用于比较不同的冗余架构，并给出修复一定数量随机故障的概率。在简要介绍后，提出了假设和方法。给出了一些说明性的例子。

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A method to calculate redundancy coverage for FLASH memories

Presents a method to calculate the redundancy coverage for FLASH memory. The method can be used to compare different redundancy architectures and gives the probability of repairing a certain number of random failures. After a brief introduction, the hypothesis and the method are presented. Some illustrative examples are provided.

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Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing

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