{"title":"高度自动化和高效的模拟环境与UVM","authors":"Hung-Yi Yang","doi":"10.1109/VLSI-DAT.2014.6834923","DOIUrl":null,"url":null,"abstract":"As design becomes more and more complicated, functional verification is getting challenging than ever. The challenges come in twofold: verification is taking longer to finish and difficult to catch all functional errors. Surveys[1] shown that functional error has been the number one reason for re-spin. How well verification is done becomes a very important issue. Re-spin not only can cost a lot due to advancing of manufacturing process but also delays the time to market which could be even more costly than re-spin itself. In order to tackle these two challenges, industry has come up with a solution called Universal Verification Methodology (UVM)[2] in recent years. But even with UVM which standardized the way for designing testbench, a simulation environment has to be well designed to take advantage of UVM and provide management of running large amount of simulations/regression in an efficient way.","PeriodicalId":267124,"journal":{"name":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Highly automated and efficient simulation environment with UVM\",\"authors\":\"Hung-Yi Yang\",\"doi\":\"10.1109/VLSI-DAT.2014.6834923\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As design becomes more and more complicated, functional verification is getting challenging than ever. The challenges come in twofold: verification is taking longer to finish and difficult to catch all functional errors. Surveys[1] shown that functional error has been the number one reason for re-spin. How well verification is done becomes a very important issue. Re-spin not only can cost a lot due to advancing of manufacturing process but also delays the time to market which could be even more costly than re-spin itself. In order to tackle these two challenges, industry has come up with a solution called Universal Verification Methodology (UVM)[2] in recent years. But even with UVM which standardized the way for designing testbench, a simulation environment has to be well designed to take advantage of UVM and provide management of running large amount of simulations/regression in an efficient way.\",\"PeriodicalId\":267124,\"journal\":{\"name\":\"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-04-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSI-DAT.2014.6834923\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-DAT.2014.6834923","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Highly automated and efficient simulation environment with UVM
As design becomes more and more complicated, functional verification is getting challenging than ever. The challenges come in twofold: verification is taking longer to finish and difficult to catch all functional errors. Surveys[1] shown that functional error has been the number one reason for re-spin. How well verification is done becomes a very important issue. Re-spin not only can cost a lot due to advancing of manufacturing process but also delays the time to market which could be even more costly than re-spin itself. In order to tackle these two challenges, industry has come up with a solution called Universal Verification Methodology (UVM)[2] in recent years. But even with UVM which standardized the way for designing testbench, a simulation environment has to be well designed to take advantage of UVM and provide management of running large amount of simulations/regression in an efficient way.