显微镜下的自动对焦

K. Lin
{"title":"显微镜下的自动对焦","authors":"K. Lin","doi":"10.1109/IECON.2007.4459944","DOIUrl":null,"url":null,"abstract":"Auto focusing (AF) is an important technique in applications for precision measurement and inspection. The technique is currently developed more focusing on high-speed implementation and under a microscopic view. This paper presents an AF algorithm composed of three stages (i.e., initial search for direction, a rough search, and a fine search). Sophisticated decision makings and abnormality handlings are built in to enhance the performance of the proposed algorithm. It is illustrated in this study that previous measures of image focus value (FV) are subject to low signal-to-noise ratio. Hence, a new measure based on the variance of sub-windowing measures is proposed to enhance the ratio. By the enhancement, the AF reliability and accuracy can be effectively improved. The proposed AF algorithm has been implemented in a PC- based laser-repairing machine. Experimental tests have been widely conducted in lab and on line as well. Selected tests are included in this paper. Among the tests, the AF time spreads over the range of 400-1700 ms with the average AF time less than 1000 ms.","PeriodicalId":199609,"journal":{"name":"IECON 2007 - 33rd Annual Conference of the IEEE Industrial Electronics Society","volume":"153 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"On Auto Focusing under a Microscopic View\",\"authors\":\"K. Lin\",\"doi\":\"10.1109/IECON.2007.4459944\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Auto focusing (AF) is an important technique in applications for precision measurement and inspection. The technique is currently developed more focusing on high-speed implementation and under a microscopic view. This paper presents an AF algorithm composed of three stages (i.e., initial search for direction, a rough search, and a fine search). Sophisticated decision makings and abnormality handlings are built in to enhance the performance of the proposed algorithm. It is illustrated in this study that previous measures of image focus value (FV) are subject to low signal-to-noise ratio. Hence, a new measure based on the variance of sub-windowing measures is proposed to enhance the ratio. By the enhancement, the AF reliability and accuracy can be effectively improved. The proposed AF algorithm has been implemented in a PC- based laser-repairing machine. Experimental tests have been widely conducted in lab and on line as well. Selected tests are included in this paper. Among the tests, the AF time spreads over the range of 400-1700 ms with the average AF time less than 1000 ms.\",\"PeriodicalId\":199609,\"journal\":{\"name\":\"IECON 2007 - 33rd Annual Conference of the IEEE Industrial Electronics Society\",\"volume\":\"153 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IECON 2007 - 33rd Annual Conference of the IEEE Industrial Electronics Society\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IECON.2007.4459944\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IECON 2007 - 33rd Annual Conference of the IEEE Industrial Electronics Society","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IECON.2007.4459944","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

自动对焦技术在精密测量和检测中有着重要的应用。目前,该技术的发展主要集中在高速实现和微观视角下。本文提出了一种由初始方向搜索、粗略搜索和精细搜索三个阶段组成的自动识别算法。为了提高算法的性能,该算法引入了复杂的决策和异常处理。本研究表明,以往的图像聚焦值(FV)测量受到低信噪比的影响。为此,提出了一种基于子窗测度方差的新测度来提高比值。通过增强,可以有效地提高自动对焦的可靠性和精度。所提出的自动对焦算法已在一台基于PC机的激光修复机上实现。在实验室和在线上进行了广泛的实验测试。本文包含了选定的试验。在这些测试中,自动对焦时间分布在400-1700 ms之间,平均自动对焦时间小于1000 ms。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On Auto Focusing under a Microscopic View
Auto focusing (AF) is an important technique in applications for precision measurement and inspection. The technique is currently developed more focusing on high-speed implementation and under a microscopic view. This paper presents an AF algorithm composed of three stages (i.e., initial search for direction, a rough search, and a fine search). Sophisticated decision makings and abnormality handlings are built in to enhance the performance of the proposed algorithm. It is illustrated in this study that previous measures of image focus value (FV) are subject to low signal-to-noise ratio. Hence, a new measure based on the variance of sub-windowing measures is proposed to enhance the ratio. By the enhancement, the AF reliability and accuracy can be effectively improved. The proposed AF algorithm has been implemented in a PC- based laser-repairing machine. Experimental tests have been widely conducted in lab and on line as well. Selected tests are included in this paper. Among the tests, the AF time spreads over the range of 400-1700 ms with the average AF time less than 1000 ms.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信