Y. Murasaka, M. Nagata, T. Ohmoto, T. Morie, A. Iwata
{"title":"基于基本矩阵计算的网络降维芯片级衬底噪声分析","authors":"Y. Murasaka, M. Nagata, T. Ohmoto, T. Morie, A. Iwata","doi":"10.1109/ISQED.2001.915275","DOIUrl":null,"url":null,"abstract":"The fundamental matrix (F-matrix) based substrate mesh reduction technique is incorporated in a chip-level substrate noise simulation methodology. A system-level equivalent circuit model of a 0.6 /spl mu/m CMOS substrate noise evaluation chip demonstrates simulation errors of less than 15% by comparing it with 100 ps 100 /spl mu/V substrate noise waveform measurements.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Chip-level substrate noise analysis with network reduction by fundamental matrix computation\",\"authors\":\"Y. Murasaka, M. Nagata, T. Ohmoto, T. Morie, A. Iwata\",\"doi\":\"10.1109/ISQED.2001.915275\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The fundamental matrix (F-matrix) based substrate mesh reduction technique is incorporated in a chip-level substrate noise simulation methodology. A system-level equivalent circuit model of a 0.6 /spl mu/m CMOS substrate noise evaluation chip demonstrates simulation errors of less than 15% by comparing it with 100 ps 100 /spl mu/V substrate noise waveform measurements.\",\"PeriodicalId\":110117,\"journal\":{\"name\":\"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-03-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2001.915275\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2001.915275","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Chip-level substrate noise analysis with network reduction by fundamental matrix computation
The fundamental matrix (F-matrix) based substrate mesh reduction technique is incorporated in a chip-level substrate noise simulation methodology. A system-level equivalent circuit model of a 0.6 /spl mu/m CMOS substrate noise evaluation chip demonstrates simulation errors of less than 15% by comparing it with 100 ps 100 /spl mu/V substrate noise waveform measurements.