{"title":"对于测试自动化，硅是免费的","authors":"T. Gheewala","doi":"10.1109/TEST.1991.519786","DOIUrl":null,"url":null,"abstract":"Test automation refers to the automatic development of test and diagnostics programs for ICs, printed circuit boards and systems. For all practical purposes, it requires the addition of test circuits on the IC to provide controllability and/or observability of signals. Internal scan, Crosscheck and boundary scan are examples of on-chip test structures that permit automatic test program dwelopment.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"For Test Automation, Silicon is Free\",\"authors\":\"T. Gheewala\",\"doi\":\"10.1109/TEST.1991.519786\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Test automation refers to the automatic development of test and diagnostics programs for ICs, printed circuit boards and systems. For all practical purposes, it requires the addition of test circuits on the IC to provide controllability and/or observability of signals. Internal scan, Crosscheck and boundary scan are examples of on-chip test structures that permit automatic test program dwelopment.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519786\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519786","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Test automation refers to the automatic development of test and diagnostics programs for ICs, printed circuit boards and systems. For all practical purposes, it requires the addition of test circuits on the IC to provide controllability and/or observability of signals. Internal scan, Crosscheck and boundary scan are examples of on-chip test structures that permit automatic test program dwelopment.
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