{"title":"TFT-LCD模组外引线键合工艺条件","authors":"D. Hu, Shyuan-Jeng Ho, Baotong Tang","doi":"10.1109/IEMT.1992.639904","DOIUrl":null,"url":null,"abstract":"Outer lead bonding (OD) of a TAB tape to a LCD glass panel is an important step in m a h g FT-LCD modules. me OLB process uses a t h e d to heat and press TAB leads against an IT0 patterned glass Hit6 an Anisotropic ConductiE Film (ACF) in k m n . l3e tempenture at the ACF, the ali&ment betwefir TAB leads and IT0 patterns at&.? the integrity of bond betwen the lFT-LCD modules and the TAB IC driver. l&pziment shows that only 20% of the particle contact mea is adequate fir a low interconnection resistance of' -TO Q. The temperature at the interhe between the ACF a!m and the m0 glass is another important parameter. Depc:nding on the thickness of the polyimide h, the temperature ditErence between the thermode and the ACF interhce can be as large as 300 OC. Another parameter used in this study is the \"thennode up\" temperature. Experiments with tw &&rent \"thermode up\" temperaatures of 340 OC and 80 OC wre studied. Mer the OLB bonding, the bonds wnt through temperature cycling betwen -40 OC and 100 'OC fbr 200 cycles. A lower \"thermode up temperature has a sli@tly better resistance to thermal cycling test than those with a Egher \"thennode up\" temperature.","PeriodicalId":403090,"journal":{"name":"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium","volume":"120 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Outer Lead Bonding Process Conditions For TFT-LCD Module\",\"authors\":\"D. Hu, Shyuan-Jeng Ho, Baotong Tang\",\"doi\":\"10.1109/IEMT.1992.639904\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Outer lead bonding (OD) of a TAB tape to a LCD glass panel is an important step in m a h g FT-LCD modules. me OLB process uses a t h e d to heat and press TAB leads against an IT0 patterned glass Hit6 an Anisotropic ConductiE Film (ACF) in k m n . l3e tempenture at the ACF, the ali&ment betwefir TAB leads and IT0 patterns at&.? the integrity of bond betwen the lFT-LCD modules and the TAB IC driver. l&pziment shows that only 20% of the particle contact mea is adequate fir a low interconnection resistance of' -TO Q. The temperature at the interhe between the ACF a!m and the m0 glass is another important parameter. Depc:nding on the thickness of the polyimide h, the temperature ditErence between the thermode and the ACF interhce can be as large as 300 OC. Another parameter used in this study is the \\\"thennode up\\\" temperature. Experiments with tw &&rent \\\"thermode up\\\" temperaatures of 340 OC and 80 OC wre studied. Mer the OLB bonding, the bonds wnt through temperature cycling betwen -40 OC and 100 'OC fbr 200 cycles. A lower \\\"thermode up temperature has a sli@tly better resistance to thermal cycling test than those with a Egher \\\"thennode up\\\" temperature.\",\"PeriodicalId\":403090,\"journal\":{\"name\":\"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium\",\"volume\":\"120 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1992.639904\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1992.639904","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
摘要
TAB胶带与LCD玻璃面板的外引线粘接(OD)是高分辨率FT-LCD模块的重要步骤。OLB工艺使用一种加热和压压TAB引线,使其与IT0压花玻璃Hit6和各向异性导电膜(ACF)在k / m / n中接触。在ACF的温度下,TAB导联和IT0模式之间的校准。lFT-LCD模块与TAB IC驱动之间的键合完整性。l&pment表明,只有20%的颗粒接触面积是足够的,以达到低的互连电阻- q。M和m0玻璃是另一个重要参数。根据聚酰亚胺厚度的不同,热模与ACF接口之间的温差可达300℃。本研究中使用的另一个参数是“然后节点上升”温度。在340℃和80℃两种“热模上升”温度下进行了实验。在OLB键合中,键能在-40℃到100℃之间进行温度循环,周期为200次。较低的“热模上升温度”与较高的“热模上升温度”相比,具有sli@tly更好的热循环测试抗性。
Outer Lead Bonding Process Conditions For TFT-LCD Module
Outer lead bonding (OD) of a TAB tape to a LCD glass panel is an important step in m a h g FT-LCD modules. me OLB process uses a t h e d to heat and press TAB leads against an IT0 patterned glass Hit6 an Anisotropic ConductiE Film (ACF) in k m n . l3e tempenture at the ACF, the ali&ment betwefir TAB leads and IT0 patterns at&.? the integrity of bond betwen the lFT-LCD modules and the TAB IC driver. l&pziment shows that only 20% of the particle contact mea is adequate fir a low interconnection resistance of' -TO Q. The temperature at the interhe between the ACF a!m and the m0 glass is another important parameter. Depc:nding on the thickness of the polyimide h, the temperature ditErence between the thermode and the ACF interhce can be as large as 300 OC. Another parameter used in this study is the "thennode up" temperature. Experiments with tw &&rent "thermode up" temperaatures of 340 OC and 80 OC wre studied. Mer the OLB bonding, the bonds wnt through temperature cycling betwen -40 OC and 100 'OC fbr 200 cycles. A lower "thermode up temperature has a sli@tly better resistance to thermal cycling test than those with a Egher "thennode up" temperature.