{"title":"eprom中的数据保留","authors":"R. E. Shiner, J. Caywood, B. Euzent","doi":"10.1109/IRPS.1980.362947","DOIUrl":null,"url":null,"abstract":"Electrically programmable read only memories (EPROMs) which are eraseable by ultraviolet irradiation long have been used in the development of microprocessor based systems and have more recently found wide applications in systems shipped into the field where the ability to correct errors or easily provide field upgrade of the system software has proven appealing to systems mantufacturers. In these latter applications it is essential to the integrity of the system that the EPROMs retain their data over tens of years under operating conditions.","PeriodicalId":270567,"journal":{"name":"18th International Reliability Physics Symposium","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"47","resultStr":"{\"title\":\"Data Retention in EPROMS\",\"authors\":\"R. E. Shiner, J. Caywood, B. Euzent\",\"doi\":\"10.1109/IRPS.1980.362947\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrically programmable read only memories (EPROMs) which are eraseable by ultraviolet irradiation long have been used in the development of microprocessor based systems and have more recently found wide applications in systems shipped into the field where the ability to correct errors or easily provide field upgrade of the system software has proven appealing to systems mantufacturers. In these latter applications it is essential to the integrity of the system that the EPROMs retain their data over tens of years under operating conditions.\",\"PeriodicalId\":270567,\"journal\":{\"name\":\"18th International Reliability Physics Symposium\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1980-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"47\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"18th International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.1980.362947\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"18th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1980.362947","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electrically programmable read only memories (EPROMs) which are eraseable by ultraviolet irradiation long have been used in the development of microprocessor based systems and have more recently found wide applications in systems shipped into the field where the ability to correct errors or easily provide field upgrade of the system software has proven appealing to systems mantufacturers. In these latter applications it is essential to the integrity of the system that the EPROMs retain their data over tens of years under operating conditions.
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