利用散斑照明和联合稀疏恢复提高荧光显微镜分辨率

J. C. Ye, Junhong Min, Jaeduck Jang
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引用次数: 0

摘要

利用光学中的非线性现象或专门的光开关探针,提出了多种远场超分辨显微技术。在这里,我们提出了一种基于线性光学的超分辨率显微镜的标准探针和实验方案。而不是利用非线性光学或光开关探针,我们使用非线性重建算法,利用联合稀疏的荧光发射从多个随机照明。为了最大限度地提高联合稀疏性的分辨率,空间非相干散斑照明被用于常规的延伸荧光显微镜装置。用标准荧光探针对纳米图案和生物样品进行染色的实验结果表明,该方法可以实现高达37nm的分辨率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improving resolution of fluorescent microscopy using speckle illumination and joint sparse recovery
A variety of far-field super-resolution microscopy techniques have been proposed recently by exploiting nonlinear phenomenon in optics or specialized photo-switchable probes. Here, we present a linear optics based super-resolution microscopy for standard probes and experimental protocols. Rather than exploiting the nonlinearity in optics or photo-switchable probes, we use a nonlinear reconstruction algorithm that exploits joint sparsity of fluorescent emission from multiple random illumination. To maximize the resolution improvement owing to the joint sparsity, spatially incoherent speckle illumination is used for conventional epi-fluorescence microscopy setup. Experimental results obtained from a nano-pattern and bio-samples stained with standard fluorescent probes along with the proposed method demonstrate that a resolution of up to 37nm can be achieved.
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