低压低频干式空芯并联电抗器匝间短路故障研究

Yumin Peng, Man Zhang, Ying Liu, Shi Jing, Qixing Huang
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引用次数: 0

摘要

干式空芯并联电抗器(DASR)发生匝间短路故障时,短路回路会消耗大量有功功率,使设备温度在短时间内升高,损坏设备。因此,在匝间短路故障的早期检测故障是非常重要的。提出了一种基于修正有功功率(Pm)和修正无功功率(Qm)的低电压低频率下DASR匝间短路故障匝数检测方法。分别在有功功率和无功功率公式中加入修正因子,得到Pm和Qm的计算公式。利用遗传算法求得它们的修正系数。研究了正常工况和短路工况下不同匝数下Pm和Qm的变化规律。对不同频率、不同故障位置的匝间短路故障进行了仿真。为检测DASR的匝间短路故障和确定短路匝数提供了一种可行的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study on Inter-Turn Short Circuit Fault of Dry-Type Air-Core Shunt Reactor Under Low Voltage with Low Frequency
When the inter-turn short circuit fault occurs in the dry-type air-core shunt reactor (DASR), the short circuit loop will consume a large amount of active power, which will cause the equipment temperature to rise in a short time and damage the equipment. Therefore, it is very important to detect the fault in the early stage of the inter-turn short circuit fault. This paper presents a method to detect the number of inter-turn short circuit fault turns of the DASR based on modified active power (Pm) and modified reactive power (Qm), at low voltage with low frequency. The formulas for Pm and Qm are obtained by adding correction factors to the formulas for active power and reactive power respectively. Their correction factors are obtained by using genetic algorithm. The variations of Pm and Qm under normal condition and short circuit condition with different turns are studied. The inter-turn short circuit fault with different frequency and different fault location is simulated. It provides a feasible method for detecting the inter-turn short circuit fault of the DASR and determining the number of short circuit turns.
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