{"title":"计量支持和生产控制的平均故障间隔时间评估","authors":"Y. Palchun, I. Yelistratova","doi":"10.1109/APEIE.2014.7040869","DOIUrl":null,"url":null,"abstract":"Any parametres have a relevant Annotation - mean time between failures diminishes in the process of system activity before some minimum value, corresponding to a set stationary process of restoration. This fact causes necessity to study in detail issues relating to stability of systems to support efficient functioning of metrological systems.","PeriodicalId":202524,"journal":{"name":"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","volume":"119 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Assessment of mean time between failures of metrological support and control of production\",\"authors\":\"Y. Palchun, I. Yelistratova\",\"doi\":\"10.1109/APEIE.2014.7040869\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Any parametres have a relevant Annotation - mean time between failures diminishes in the process of system activity before some minimum value, corresponding to a set stationary process of restoration. This fact causes necessity to study in detail issues relating to stability of systems to support efficient functioning of metrological systems.\",\"PeriodicalId\":202524,\"journal\":{\"name\":\"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)\",\"volume\":\"119 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEIE.2014.7040869\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEIE.2014.7040869","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Assessment of mean time between failures of metrological support and control of production
Any parametres have a relevant Annotation - mean time between failures diminishes in the process of system activity before some minimum value, corresponding to a set stationary process of restoration. This fact causes necessity to study in detail issues relating to stability of systems to support efficient functioning of metrological systems.