基于脉冲响应的配电网芯片封装谐振建模

Y. Uematsu, H. Osaka, M. Yagyu, T. Saito
{"title":"基于脉冲响应的配电网芯片封装谐振建模","authors":"Y. Uematsu, H. Osaka, M. Yagyu, T. Saito","doi":"10.1109/SPI.2010.5483595","DOIUrl":null,"url":null,"abstract":"This paper proposes a method for modeling chip-package resonance using impulse response. To extract chip and package electrical circuit parameters, we assume a circuit equivalent to the loop from the chip to the package decoupling capacitor as the RL-RC parallel circuit and convert it into an RLC parallel circuit. We apply this method to devise an electrical circuit model capable of expressing chip-package resonance with high accuracy, as confirmed by experimental results.","PeriodicalId":293987,"journal":{"name":"2010 IEEE 14th Workshop on Signal Propagation on Interconnects","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Modeling of chip-package resonance in power distribution networks by an impulse response\",\"authors\":\"Y. Uematsu, H. Osaka, M. Yagyu, T. Saito\",\"doi\":\"10.1109/SPI.2010.5483595\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a method for modeling chip-package resonance using impulse response. To extract chip and package electrical circuit parameters, we assume a circuit equivalent to the loop from the chip to the package decoupling capacitor as the RL-RC parallel circuit and convert it into an RLC parallel circuit. We apply this method to devise an electrical circuit model capable of expressing chip-package resonance with high accuracy, as confirmed by experimental results.\",\"PeriodicalId\":293987,\"journal\":{\"name\":\"2010 IEEE 14th Workshop on Signal Propagation on Interconnects\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE 14th Workshop on Signal Propagation on Interconnects\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SPI.2010.5483595\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE 14th Workshop on Signal Propagation on Interconnects","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI.2010.5483595","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

提出了一种基于脉冲响应的芯片封装谐振建模方法。为了提取芯片和封装的电路参数,我们假设从芯片到封装去耦电容的环路等效电路为RL-RC并联电路,并将其转换为RLC并联电路。我们利用这种方法设计了一种能够高精度表达芯片封装共振的电路模型,实验结果证实了这一点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modeling of chip-package resonance in power distribution networks by an impulse response
This paper proposes a method for modeling chip-package resonance using impulse response. To extract chip and package electrical circuit parameters, we assume a circuit equivalent to the loop from the chip to the package decoupling capacitor as the RL-RC parallel circuit and convert it into an RLC parallel circuit. We apply this method to devise an electrical circuit model capable of expressing chip-package resonance with high accuracy, as confirmed by experimental results.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信