{"title":"用于室温下亚太赫兹连续波(CW)检测的0.35µm AMS硅MOSFET","authors":"M. Othman, I. Harrison","doi":"10.1109/ISTMET.2014.6936556","DOIUrl":null,"url":null,"abstract":"In this paper we report the detection of sub-THz radiation at 220 GHz by using 0.35 μm Metal Oxide Semiconductor Field Effect Transistor (MOSFET). The observation of photoresponse are measured against gate voltage with a drain current effect at room temperature. The measured photoresponse is a superposition of a generally increasing response with a decrease in VGS coupled with a small peak approximately at threshold and there is an evidence that the MOSFET can be a sensitive sub-THz detector in the room temperature.","PeriodicalId":364834,"journal":{"name":"2014 International Symposium on Technology Management and Emerging Technologies","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"0.35 µm AMS silicon MOSFET for continous-wave (CW) sub-THz detection in room temperature\",\"authors\":\"M. Othman, I. Harrison\",\"doi\":\"10.1109/ISTMET.2014.6936556\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we report the detection of sub-THz radiation at 220 GHz by using 0.35 μm Metal Oxide Semiconductor Field Effect Transistor (MOSFET). The observation of photoresponse are measured against gate voltage with a drain current effect at room temperature. The measured photoresponse is a superposition of a generally increasing response with a decrease in VGS coupled with a small peak approximately at threshold and there is an evidence that the MOSFET can be a sensitive sub-THz detector in the room temperature.\",\"PeriodicalId\":364834,\"journal\":{\"name\":\"2014 International Symposium on Technology Management and Emerging Technologies\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 International Symposium on Technology Management and Emerging Technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISTMET.2014.6936556\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Symposium on Technology Management and Emerging Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISTMET.2014.6936556","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
0.35 µm AMS silicon MOSFET for continous-wave (CW) sub-THz detection in room temperature
In this paper we report the detection of sub-THz radiation at 220 GHz by using 0.35 μm Metal Oxide Semiconductor Field Effect Transistor (MOSFET). The observation of photoresponse are measured against gate voltage with a drain current effect at room temperature. The measured photoresponse is a superposition of a generally increasing response with a decrease in VGS coupled with a small peak approximately at threshold and there is an evidence that the MOSFET can be a sensitive sub-THz detector in the room temperature.