{"title":"一种用于Sub-40nm MLC NAND闪存及更先进存储器的具有临时LSB存储方案的零元间干扰页架构","authors":"Ki-Tae Park","doi":"10.1109/VLSIC.2007.4342709","DOIUrl":null,"url":null,"abstract":"A new page architecture with temporary LSB storing program scheme is presented as a breakthrough solution for sub-40nm FG (floating-gate) MLC NAND flash memories and beyond. Without program speed degradation, the proposed method is able to eliminate 100% BL cell-to-cell and almost 50% WL cell-to-cell coupling interferences which are well known as a most critical scaling barrier for FG NAND flash memories.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"A Zeroing Cell-to-Cell Interference Page Architecture with Temporary LSB Storing Program Scheme for Sub-40nm MLC NAND Flash Memories and beyond\",\"authors\":\"Ki-Tae Park\",\"doi\":\"10.1109/VLSIC.2007.4342709\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new page architecture with temporary LSB storing program scheme is presented as a breakthrough solution for sub-40nm FG (floating-gate) MLC NAND flash memories and beyond. Without program speed degradation, the proposed method is able to eliminate 100% BL cell-to-cell and almost 50% WL cell-to-cell coupling interferences which are well known as a most critical scaling barrier for FG NAND flash memories.\",\"PeriodicalId\":261092,\"journal\":{\"name\":\"2007 IEEE Symposium on VLSI Circuits\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-06-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Symposium on VLSI Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2007.4342709\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2007.4342709","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Zeroing Cell-to-Cell Interference Page Architecture with Temporary LSB Storing Program Scheme for Sub-40nm MLC NAND Flash Memories and beyond
A new page architecture with temporary LSB storing program scheme is presented as a breakthrough solution for sub-40nm FG (floating-gate) MLC NAND flash memories and beyond. Without program speed degradation, the proposed method is able to eliminate 100% BL cell-to-cell and almost 50% WL cell-to-cell coupling interferences which are well known as a most critical scaling barrier for FG NAND flash memories.