平面接触器件高频特性的测量装置

39th ARFTG Conference Digest Pub Date : 1992-06-01 DOI:10.1109/ARFTG.1992.326969

P. Degraeuwe, L. Martens, D. De Zutter

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引用次数: 10

摘要

为了对具有非同轴平面接触的大型结构(如pcb互连、连接器和多芯片模块)进行精确的频率和时域测量，建立了一种新的共面探头测量系统。通过对FR4-PCB微带线的测量，说明了该系统的优点。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Measurement Set-Up for High-Frequency Characterization of Planar Contact Devices

A new measurement system using coplanar probe heads has been built in order to perform accurate frequency and time domain measurements on large structures with non-coaxial planar contacts, such as interconnections on PCBs, connectors and multichip modules. The advantages of the system are illustrated by measurements on microstrip lines on a FR4-PCB.

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来源期刊

39th ARFTG Conference Digest

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