采用高分辨率硅模板掩模制造的顶接触有机晶体管和互补电路

F. Ante, F. Letzkus, J. Butschke, U. Zschieschang, J. Burghartz, Klaus Kern, H. Klauk
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引用次数: 11

摘要

场效应晶体管的最大工作频率与其横向尺寸成反比。尺寸小于等于1µm的有机薄膜晶体管(TFTs)已经通过光刻[1]、电子束光刻(EBL)[2]、纳米压印(NIL)[3]、亚飞升喷墨打印(SIJ)[4]和自定向喷墨打印(SAP)[5]制造出来。其中一些方法(EBL, SIJ, SAP)的吞吐量很小,其他方法(EBL, NIL,光刻)涉及溶剂或高工艺温度。由于高迁移率的小分子有机半导体在暴露于溶剂或加热时经常发生相变[6,7],因此这些方法通常不适合在此类半导体的顶部绘制源极和漏极触点的图案。作为替代方案,高分辨率的模板掩模提供了高通量的顶部接触模式的可能性,而不需要溶剂或高温。例如,Jin等人报道了采用全局硅后门和高分辨率氮化硅模板掩模制备的通道长度为1.8µm的顶接触五苯tft[8]。对于通道长度较短的器件,顶部接触有机TFTs通常比底部接触TFTs提供更好的性能[9]。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Top-contact organic transistors and complementary circuits fabricated using high-resolution silicon stencil masks
The maximum operating frequency of a field-effect transistor is inversely proportional to its lateral dimensions. Organic thin-film transistors (TFTs) with dimensions of ∼1 µm or less have been fabricated by photolithography [1], electron-beam lithography (EBL) [2], nano-imprint lithography (NIL) [3], sub-femtoliter inkjet printing (SIJ) [4] and self-aligned inkjet printing (SAP) [5]. Some of these methods (EBL, SIJ, SAP) have small throughput, others (EBL, NIL, photolithography) involve solvents or high process temperatures. Since high-mobility small-molecule organic semiconductors often undergo phase transitions when exposed to solvents or heat [6,7], these methods are in general not suitable to pattern source and drain contacts on top of such semiconductors. As an alternative, high-resolution stencil masks offer the possibility to pattern top contacts with high throughput and without the need for solvents or elevated temperatures. For example, Jin et al. reported top-contact pentacene TFTs with a channel length of 1.8 µm fabricated by using a global silicon back gate and a high-resolution silicon nitride stencil mask [8]. For devices with short channel lengths, top-contact organic TFTs usually provide better performance than bottom-contact TFTs [9].
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