F. Ante, F. Letzkus, J. Butschke, U. Zschieschang, J. Burghartz, Klaus Kern, H. Klauk
{"title":"采用高分辨率硅模板掩模制造的顶接触有机晶体管和互补电路","authors":"F. Ante, F. Letzkus, J. Butschke, U. Zschieschang, J. Burghartz, Klaus Kern, H. Klauk","doi":"10.1109/DRC.2010.5551894","DOIUrl":null,"url":null,"abstract":"The maximum operating frequency of a field-effect transistor is inversely proportional to its lateral dimensions. Organic thin-film transistors (TFTs) with dimensions of ∼1 µm or less have been fabricated by photolithography [1], electron-beam lithography (EBL) [2], nano-imprint lithography (NIL) [3], sub-femtoliter inkjet printing (SIJ) [4] and self-aligned inkjet printing (SAP) [5]. Some of these methods (EBL, SIJ, SAP) have small throughput, others (EBL, NIL, photolithography) involve solvents or high process temperatures. Since high-mobility small-molecule organic semiconductors often undergo phase transitions when exposed to solvents or heat [6,7], these methods are in general not suitable to pattern source and drain contacts on top of such semiconductors. As an alternative, high-resolution stencil masks offer the possibility to pattern top contacts with high throughput and without the need for solvents or elevated temperatures. For example, Jin et al. reported top-contact pentacene TFTs with a channel length of 1.8 µm fabricated by using a global silicon back gate and a high-resolution silicon nitride stencil mask [8]. For devices with short channel lengths, top-contact organic TFTs usually provide better performance than bottom-contact TFTs [9].","PeriodicalId":396875,"journal":{"name":"68th Device Research Conference","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Top-contact organic transistors and complementary circuits fabricated using high-resolution silicon stencil masks\",\"authors\":\"F. Ante, F. Letzkus, J. Butschke, U. Zschieschang, J. Burghartz, Klaus Kern, H. Klauk\",\"doi\":\"10.1109/DRC.2010.5551894\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The maximum operating frequency of a field-effect transistor is inversely proportional to its lateral dimensions. Organic thin-film transistors (TFTs) with dimensions of ∼1 µm or less have been fabricated by photolithography [1], electron-beam lithography (EBL) [2], nano-imprint lithography (NIL) [3], sub-femtoliter inkjet printing (SIJ) [4] and self-aligned inkjet printing (SAP) [5]. Some of these methods (EBL, SIJ, SAP) have small throughput, others (EBL, NIL, photolithography) involve solvents or high process temperatures. Since high-mobility small-molecule organic semiconductors often undergo phase transitions when exposed to solvents or heat [6,7], these methods are in general not suitable to pattern source and drain contacts on top of such semiconductors. As an alternative, high-resolution stencil masks offer the possibility to pattern top contacts with high throughput and without the need for solvents or elevated temperatures. For example, Jin et al. reported top-contact pentacene TFTs with a channel length of 1.8 µm fabricated by using a global silicon back gate and a high-resolution silicon nitride stencil mask [8]. For devices with short channel lengths, top-contact organic TFTs usually provide better performance than bottom-contact TFTs [9].\",\"PeriodicalId\":396875,\"journal\":{\"name\":\"68th Device Research Conference\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"68th Device Research Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DRC.2010.5551894\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"68th Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2010.5551894","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Top-contact organic transistors and complementary circuits fabricated using high-resolution silicon stencil masks
The maximum operating frequency of a field-effect transistor is inversely proportional to its lateral dimensions. Organic thin-film transistors (TFTs) with dimensions of ∼1 µm or less have been fabricated by photolithography [1], electron-beam lithography (EBL) [2], nano-imprint lithography (NIL) [3], sub-femtoliter inkjet printing (SIJ) [4] and self-aligned inkjet printing (SAP) [5]. Some of these methods (EBL, SIJ, SAP) have small throughput, others (EBL, NIL, photolithography) involve solvents or high process temperatures. Since high-mobility small-molecule organic semiconductors often undergo phase transitions when exposed to solvents or heat [6,7], these methods are in general not suitable to pattern source and drain contacts on top of such semiconductors. As an alternative, high-resolution stencil masks offer the possibility to pattern top contacts with high throughput and without the need for solvents or elevated temperatures. For example, Jin et al. reported top-contact pentacene TFTs with a channel length of 1.8 µm fabricated by using a global silicon back gate and a high-resolution silicon nitride stencil mask [8]. For devices with short channel lengths, top-contact organic TFTs usually provide better performance than bottom-contact TFTs [9].