带部分扫描的全扫描故障覆盖

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) Pub Date : 1999-01-01 DOI:10.1145/307418.307545

X. Lin, I. Pomeranz, S. Reddy

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引用次数: 27

摘要

提出了一种基于测试生成的局部扫描选择方法。该程序能够通过仅扫描触发器的一个子集来实现与全扫描设计相同的故障覆盖级别。在此过程中，使用了新的措施来指导触发器的选择。所提出的程序适用于ISCAS-89和ADDENDUM-93基准电路。对于所有电路，在扫描触发器的一部分时，可以实现与全扫描相同的故障覆盖。

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Full scan fault coverage with partial scan

In this paper, a test generation based partial scan selection procedure is proposed. The procedure is able to achieve the same level of fault coverage as in a full scan design by scanning only a subset of the flip-flops. New measures are used to guide the flip-flop selection during the procedure. The proposed procedure is applied to the ISCAS-89 and the ADDENDUM-93 benchmark circuits. For all the circuits, it is possible to achieve the same fault coverage as that for full scan while scanning a portion of the flip-flops.

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来源期刊

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)

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