{"title":"使用INL测量的adc静态传递函数的行为建模","authors":"R. Guindi, N. Saada","doi":"10.1109/ICM.2010.5696085","DOIUrl":null,"url":null,"abstract":"In this paper, we present a modeling approach for analog-to-digital converters (ADCs) based on modeling the static transfer function using integral nonlinearity (INL) measurements. The methodology relies on applying a Fast Fourier Transform (FFT) test to the output of a real ADC circuit and extracting the significant harmonics. These are used in a behavioral functional model to approximate the INL using a polynomial function. The resulting model is independent of the ADC type or structure, and is suitable for bottom-up system verification. We compare the performance of the new model with other models based on different modeling approaches, and show a gain in simulation speed of up to 300X.","PeriodicalId":215859,"journal":{"name":"2010 International Conference on Microelectronics","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Behavioral modeling of the static transfer function of ADCs using INL measurements\",\"authors\":\"R. Guindi, N. Saada\",\"doi\":\"10.1109/ICM.2010.5696085\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present a modeling approach for analog-to-digital converters (ADCs) based on modeling the static transfer function using integral nonlinearity (INL) measurements. The methodology relies on applying a Fast Fourier Transform (FFT) test to the output of a real ADC circuit and extracting the significant harmonics. These are used in a behavioral functional model to approximate the INL using a polynomial function. The resulting model is independent of the ADC type or structure, and is suitable for bottom-up system verification. We compare the performance of the new model with other models based on different modeling approaches, and show a gain in simulation speed of up to 300X.\",\"PeriodicalId\":215859,\"journal\":{\"name\":\"2010 International Conference on Microelectronics\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Conference on Microelectronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2010.5696085\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on Microelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2010.5696085","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Behavioral modeling of the static transfer function of ADCs using INL measurements
In this paper, we present a modeling approach for analog-to-digital converters (ADCs) based on modeling the static transfer function using integral nonlinearity (INL) measurements. The methodology relies on applying a Fast Fourier Transform (FFT) test to the output of a real ADC circuit and extracting the significant harmonics. These are used in a behavioral functional model to approximate the INL using a polynomial function. The resulting model is independent of the ADC type or structure, and is suitable for bottom-up system verification. We compare the performance of the new model with other models based on different modeling approaches, and show a gain in simulation speed of up to 300X.