测量和提高数字电路行为描述可测试性的方法

J. Santucci, G. Dray, M. Boumédine, N. Giambiasi
{"title":"测量和提高数字电路行为描述可测试性的方法","authors":"J. Santucci, G. Dray, M. Boumédine, N. Giambiasi","doi":"10.1109/ATS.1992.224448","DOIUrl":null,"url":null,"abstract":"The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Methods to measure and to enhance the testability of behavioral descriptions of digital circuits\",\"authors\":\"J. Santucci, G. Dray, M. Boumédine, N. Giambiasi\",\"doi\":\"10.1109/ATS.1992.224448\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224448\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224448","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

提出了一种降低行为描述测试模式生成成本的方法。这种方法利用了一组方法,允许设计者评估并增强行为描述的可测试性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Methods to measure and to enhance the testability of behavioral descriptions of digital circuits
The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions.<>
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