{"title":"测量和提高数字电路行为描述可测试性的方法","authors":"J. Santucci, G. Dray, M. Boumédine, N. Giambiasi","doi":"10.1109/ATS.1992.224448","DOIUrl":null,"url":null,"abstract":"The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Methods to measure and to enhance the testability of behavioral descriptions of digital circuits\",\"authors\":\"J. Santucci, G. Dray, M. Boumédine, N. Giambiasi\",\"doi\":\"10.1109/ATS.1992.224448\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224448\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224448","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Methods to measure and to enhance the testability of behavioral descriptions of digital circuits
The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions.<>