{"title":"一个专家系统，以协助诊断故障的超大规模集成电路存储器","authors":"T. Viacroze, M. Lequeux","doi":"10.1109/CICC.1989.56838","DOIUrl":null,"url":null,"abstract":"A description is given of an expert system that helps diagnose failures on VLSI memories. The expert system is intended to be used in the fields of quality assurance and failure analysis. After a discussion of the problem and the definition of the project, the different databases used and the architecture of the expert system are described. Then, the strategy of the system, which depends on the kind of failure diagnosed after a first-level analysis, is explained. Current developments are discussed that are intended to improve the capability of the expert system and depth of diagnosis","PeriodicalId":165054,"journal":{"name":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An expert system to assist in diagnosis of failures on VLSI memories\",\"authors\":\"T. Viacroze, M. Lequeux\",\"doi\":\"10.1109/CICC.1989.56838\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A description is given of an expert system that helps diagnose failures on VLSI memories. The expert system is intended to be used in the fields of quality assurance and failure analysis. After a discussion of the problem and the definition of the project, the different databases used and the architecture of the expert system are described. Then, the strategy of the system, which depends on the kind of failure diagnosed after a first-level analysis, is explained. Current developments are discussed that are intended to improve the capability of the expert system and depth of diagnosis\",\"PeriodicalId\":165054,\"journal\":{\"name\":\"1989 Proceedings of the IEEE Custom Integrated Circuits Conference\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1989 Proceedings of the IEEE Custom Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.1989.56838\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1989.56838","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An expert system to assist in diagnosis of failures on VLSI memories
A description is given of an expert system that helps diagnose failures on VLSI memories. The expert system is intended to be used in the fields of quality assurance and failure analysis. After a discussion of the problem and the definition of the project, the different databases used and the architecture of the expert system are described. Then, the strategy of the system, which depends on the kind of failure diagnosed after a first-level analysis, is explained. Current developments are discussed that are intended to improve the capability of the expert system and depth of diagnosis
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