COOLMOS/sup TM -高压电源MOS的新里程碑

L. Lorenz, G. Deboy, A. Knapp, M. Mârz
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引用次数: 218

摘要

最近,一种用于高压功率mosfet的新技术被引入:CoolMOS/sup TM/。基于电荷补偿的新器件概念,例如,600 V晶体管的R/sub DS(on)/面积积降低了5倍。器件显示没有双极电流的贡献,就像在igbt关断阶段观察到的众所周知的尾电流一样。CoolMOS/sup TM/实际上结合了MOSFET的低开关损耗和IGBT的导通损耗。此外,重新定义了R/sub / DS对击穿电压的依赖关系。在标准MOSFET的情况下,超过平方定律的依赖关系已被打破,实现了线性电压依赖关系。这为新的应用领域开辟了道路,即使没有雪崩操作。系统小型化、更高的开关频率、更低的电路寄生、更高的效率和更低的系统成本是未来发展的方向。新技术不仅在降低R/sub DS(on)/值方面取得了突破,而且还为器件电容设定了新的基准。由于芯片收缩和新颖的内部结构,该技术显示出非常小的输入电容和强烈的非线性输出电容。极低的栅极电荷有助于降低可控性的成本,较小的反馈电容降低了动态损耗。通过这项新技术,所有封装中的最小R/sub DS(on)/值在重要的600-1000 V类别中被重新定义。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
COOLMOS/sup TM/-a new milestone in high voltage power MOS
Recently, a new technology for high voltage power MOSFETs has been introduced: the CoolMOS/sup TM/. Based on the new device concept of charge compensation, the R/sub DS(on)/ area product for e.g. 600 V transistors has been reduced by a factor of 5. The devices show no bipolar current contribution like the well known tail current observed during the turn-off phase of IGBTs. CoolMOS/sup TM/ virtually combines the low switching losses of a MOSFET with the on-state losses of an IGBT. Furthermore, the dependence of R/sub DS(on)/ on the breakdown voltage has been redefined. The more than square-law dependence in the case of standard MOSFET has been broken and a linear voltage dependence achieved. This opens the way to new fields of application even without avalanche operation. System miniaturization, higher switching frequencies, lower circuit parasitics, higher efficiency, and reduced system costs are pointing the way towards future developments. Not only has the new technology achieved breakthrough at reduced R/sub DS(on)/ values, but new benchmarks have also been set for the device capacitances. Due to chip shrinkage and a novel internal structure, the technology shows both a very small input capacitance and a strongly nonlinear output capacitance. The drastically lower gate charge facilitates and reduces the cost of controllability, and the smaller feedback capacitance reduces the dynamic losses. With this new technology, the minimum R/sub DS(on)/ values in all packages are being redefined in the important 600-1000 V categories.
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