A. Jha, P. Leisher, Chen Li, K. Pipe, M. Crowley, D. Fullager, J. Helmrich, P. Thiagarajan, R. Deri, R. Swertfeger
{"title":"利用热反射率测量高功率二极管激光器的表面光吸收","authors":"A. Jha, P. Leisher, Chen Li, K. Pipe, M. Crowley, D. Fullager, J. Helmrich, P. Thiagarajan, R. Deri, R. Swertfeger","doi":"10.1109/hpd48113.2019.8938681","DOIUrl":null,"url":null,"abstract":"Severe heating due to partial absorption of outcoupled emission at the facet of a high-power diode laser can lead to catastrophic optical damage. The degree of absorption and subsequent heating at the facet is a function of the emission wavelength, the absorption properties of facet coatings and passivation layers, and the age of the device. The ability to quantify facet absorption is an essential step toward improving the reliability of diode laser systems and rapid development of passivation technologies. In this work, we have developed a technique to measure facet absorption in diode lasers using a combination of facet thermoreflectance imaging and a heat transport model. The approach can be used for a wide range of both coated and uncoated diode lasers.","PeriodicalId":384472,"journal":{"name":"2019 IEEE High Power Diode Lasers and Systems Conference (HPD)","volume":"111 3S 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Measurement of facet optical absorption in high power diode lasers using thermoreflectance\",\"authors\":\"A. Jha, P. Leisher, Chen Li, K. Pipe, M. Crowley, D. Fullager, J. Helmrich, P. Thiagarajan, R. Deri, R. Swertfeger\",\"doi\":\"10.1109/hpd48113.2019.8938681\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Severe heating due to partial absorption of outcoupled emission at the facet of a high-power diode laser can lead to catastrophic optical damage. The degree of absorption and subsequent heating at the facet is a function of the emission wavelength, the absorption properties of facet coatings and passivation layers, and the age of the device. The ability to quantify facet absorption is an essential step toward improving the reliability of diode laser systems and rapid development of passivation technologies. In this work, we have developed a technique to measure facet absorption in diode lasers using a combination of facet thermoreflectance imaging and a heat transport model. The approach can be used for a wide range of both coated and uncoated diode lasers.\",\"PeriodicalId\":384472,\"journal\":{\"name\":\"2019 IEEE High Power Diode Lasers and Systems Conference (HPD)\",\"volume\":\"111 3S 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE High Power Diode Lasers and Systems Conference (HPD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/hpd48113.2019.8938681\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE High Power Diode Lasers and Systems Conference (HPD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/hpd48113.2019.8938681","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement of facet optical absorption in high power diode lasers using thermoreflectance
Severe heating due to partial absorption of outcoupled emission at the facet of a high-power diode laser can lead to catastrophic optical damage. The degree of absorption and subsequent heating at the facet is a function of the emission wavelength, the absorption properties of facet coatings and passivation layers, and the age of the device. The ability to quantify facet absorption is an essential step toward improving the reliability of diode laser systems and rapid development of passivation technologies. In this work, we have developed a technique to measure facet absorption in diode lasers using a combination of facet thermoreflectance imaging and a heat transport model. The approach can be used for a wide range of both coated and uncoated diode lasers.