{"title":"一种有效的方法来表征静态时序分析的TSPC触发器设置时间","authors":"Sayyaparaju Sagar Varma, A. Sharma, B. Anand","doi":"10.1109/SMACD.2016.7520724","DOIUrl":null,"url":null,"abstract":"Static timing analysis (STA), which is a part of design automation requires the generation and storage of delay values for combinational standard cells and the setup and hold time values for sequential cells at numerous corners in the form of a Look Up Table (LUT). This paper proposes a novel approach for LUT generation of sequential standard cells by developing a model for the setup time. The model uses the input data transition time (TR) and the output capacitance (CL) as its variables with two fitting parameters. The model's validity is verified through simulations in Cadence Virtuoso and using this model, it is shown that it reduces the number of simulations needed for the generation of a 6 × 6 LUT by 91.67%, while having an average percentage error of 2.28%. Also, the dependence of the fitting parameters on the sizing of the devices and their relation with process, voltage and temperature variations is shown and verified.","PeriodicalId":441203,"journal":{"name":"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"An efficient methodology to characterize the TSPC flip flop setup time for static timing analysis\",\"authors\":\"Sayyaparaju Sagar Varma, A. Sharma, B. Anand\",\"doi\":\"10.1109/SMACD.2016.7520724\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Static timing analysis (STA), which is a part of design automation requires the generation and storage of delay values for combinational standard cells and the setup and hold time values for sequential cells at numerous corners in the form of a Look Up Table (LUT). This paper proposes a novel approach for LUT generation of sequential standard cells by developing a model for the setup time. The model uses the input data transition time (TR) and the output capacitance (CL) as its variables with two fitting parameters. The model's validity is verified through simulations in Cadence Virtuoso and using this model, it is shown that it reduces the number of simulations needed for the generation of a 6 × 6 LUT by 91.67%, while having an average percentage error of 2.28%. Also, the dependence of the fitting parameters on the sizing of the devices and their relation with process, voltage and temperature variations is shown and verified.\",\"PeriodicalId\":441203,\"journal\":{\"name\":\"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMACD.2016.7520724\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMACD.2016.7520724","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An efficient methodology to characterize the TSPC flip flop setup time for static timing analysis
Static timing analysis (STA), which is a part of design automation requires the generation and storage of delay values for combinational standard cells and the setup and hold time values for sequential cells at numerous corners in the form of a Look Up Table (LUT). This paper proposes a novel approach for LUT generation of sequential standard cells by developing a model for the setup time. The model uses the input data transition time (TR) and the output capacitance (CL) as its variables with two fitting parameters. The model's validity is verified through simulations in Cadence Virtuoso and using this model, it is shown that it reduces the number of simulations needed for the generation of a 6 × 6 LUT by 91.67%, while having an average percentage error of 2.28%. Also, the dependence of the fitting parameters on the sizing of the devices and their relation with process, voltage and temperature variations is shown and verified.