D. Zelenchuk, V. Fusco, James Breslin, M. Keaveney
{"title":"多层LTCC衬底的毫米波介电特性","authors":"D. Zelenchuk, V. Fusco, James Breslin, M. Keaveney","doi":"10.1109/EUMC.2015.7345943","DOIUrl":null,"url":null,"abstract":"The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz - 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.","PeriodicalId":350086,"journal":{"name":"2015 European Microwave Conference (EuMC)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Millimetre wave dielectric chartacterisation of multilayer LTCC substrate\",\"authors\":\"D. Zelenchuk, V. Fusco, James Breslin, M. Keaveney\",\"doi\":\"10.1109/EUMC.2015.7345943\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz - 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.\",\"PeriodicalId\":350086,\"journal\":{\"name\":\"2015 European Microwave Conference (EuMC)\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 European Microwave Conference (EuMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMC.2015.7345943\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 European Microwave Conference (EuMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMC.2015.7345943","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Millimetre wave dielectric chartacterisation of multilayer LTCC substrate
The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz - 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.