未来边缘ai处理器的可靠性:潘多拉的盒子

M. Gomony, A. Gebregiorgis, M. Fieback, M. Geilen, S. Stuijk, Jan Richter-Brockmann, R. Bishnoi, Sven Argo, Lara Arche Andradas, T. Güneysu, M. Taouil, H. Corporaal, S. Hamdioui
{"title":"未来边缘ai处理器的可靠性:潘多拉的盒子","authors":"M. Gomony, A. Gebregiorgis, M. Fieback, M. Geilen, S. Stuijk, Jan Richter-Brockmann, R. Bishnoi, Sven Argo, Lara Arche Andradas, T. Güneysu, M. Taouil, H. Corporaal, S. Hamdioui","doi":"10.1109/ETS56758.2023.10174180","DOIUrl":null,"url":null,"abstract":"This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these emerging devices inherently suffering from many non-idealities are calling for new solutions in order to ensure accurate and reliable edge computing. Moreover, the paper also covers the security aspects for future edge processors and shows the challenges and the future directions.","PeriodicalId":211522,"journal":{"name":"2023 IEEE European Test Symposium (ETS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Dependability of Future Edge-AI Processors: Pandora’s Box\",\"authors\":\"M. Gomony, A. Gebregiorgis, M. Fieback, M. Geilen, S. Stuijk, Jan Richter-Brockmann, R. Bishnoi, Sven Argo, Lara Arche Andradas, T. Güneysu, M. Taouil, H. Corporaal, S. Hamdioui\",\"doi\":\"10.1109/ETS56758.2023.10174180\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these emerging devices inherently suffering from many non-idealities are calling for new solutions in order to ensure accurate and reliable edge computing. Moreover, the paper also covers the security aspects for future edge processors and shows the challenges and the future directions.\",\"PeriodicalId\":211522,\"journal\":{\"name\":\"2023 IEEE European Test Symposium (ETS)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS56758.2023.10174180\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS56758.2023.10174180","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文讨论了HORIZON EU CONVOLVE项目的一个方向,即基于内存计算和新兴存储器器件(如RRAM)的智能边缘处理器的可靠性。它讨论了这种替代计算范式将如何改变我们过去进行制造测试的方式。此外,它还描述了这些新兴设备如何固有地遭受许多非理想性的困扰,从而需要新的解决方案来确保精确和可靠的边缘计算。此外,本文还涵盖了未来边缘处理器的安全方面,并指出了挑战和未来的方向。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Dependability of Future Edge-AI Processors: Pandora’s Box
This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these emerging devices inherently suffering from many non-idealities are calling for new solutions in order to ensure accurate and reliable edge computing. Moreover, the paper also covers the security aspects for future edge processors and shows the challenges and the future directions.
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