{"title":"在商业生产线上生产的抗辐射冷保护输入/输出缓冲器","authors":"J. Benedetto, A. Jordan","doi":"10.1109/REDW.1999.816060","DOIUrl":null,"url":null,"abstract":"The radiation hardness of a cold sparing buffer manufactured on a commercial process line is demonstrated. The buffer is shown to be resistant to total dose ionizing radiation and immune (>128 MeV-cm/sup 2//mg) to effects from heavy ions such as single event upset (SEU) and single event latch-up (SEL).","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A radiation-hardened cold sparing input/output buffer manufactured on a commercial process line\",\"authors\":\"J. Benedetto, A. Jordan\",\"doi\":\"10.1109/REDW.1999.816060\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The radiation hardness of a cold sparing buffer manufactured on a commercial process line is demonstrated. The buffer is shown to be resistant to total dose ionizing radiation and immune (>128 MeV-cm/sup 2//mg) to effects from heavy ions such as single event upset (SEU) and single event latch-up (SEL).\",\"PeriodicalId\":447869,\"journal\":{\"name\":\"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-07-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.1999.816060\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.1999.816060","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A radiation-hardened cold sparing input/output buffer manufactured on a commercial process line
The radiation hardness of a cold sparing buffer manufactured on a commercial process line is demonstrated. The buffer is shown to be resistant to total dose ionizing radiation and immune (>128 MeV-cm/sup 2//mg) to effects from heavy ions such as single event upset (SEU) and single event latch-up (SEL).