基于自愈细胞的容错四态逻辑

T. Panhofer, W. Friesenbichler, M. Delvai
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引用次数: 11

摘要

现代集成电路的集成度越来越高,运行速度越来越快,特征尺寸越来越小,电源电压越来越低。这些特性使电路更容易出错,需要容错实现要求高可靠性的应用,例如空间任务。在以前的工作中,我们提出了一种利用异步四态逻辑(FSL)获得容错数字电路的概念。这种类型的逻辑已经显示出高度的容错性,大多数故障只是使电路停止(死锁)。其余类型的故障由时间冗余处理。添加死锁检测单元并引入自愈细胞(shc)的概念,可以实现高可靠的电路,甚至可以容忍多个故障。然而,我们的实验表明,一些特定的故障星座既不会引起死锁,也不会被冗余计算检测到。我们提出了两种改进的错误检测方法,它们甚至可以捕获这些类型的错误。此外,还比较了SHC的大小和实现的容错能力。出现多个故障。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fault tolerant Four-State Logic by using Self-Healing Cells
The trend towards higher integration and faster operating speed leads to decreasing feature sizes and lower supply voltages in modern integrated circuits. These properties make the circuits more error-prone, requiring a fault tolerant implementation for applications demanding high reliability, e.g. space missions. In previous work we presented a concept how to obtain fault tolerant digital circuits by using asynchronous four-state logic (FSL). This type of logic already exhibits a high degree of fault tolerance where most faults simply halt the circuit (deadlock). The remaining types of faults are handled by temporal redundancy. Adding a deadlock detection unit and introducing the concept of self-healing cells (SHCs) leads to a highly reliable circuit that is able to tolerate even multiple faults. However our experiments revealed that some specific fault constellations neither cause a deadlock nor are they detected by a redundant calculation. We present two improved ways of error detection, which allow to capture even these types of faults. Further, a comparison between the size of an SHC and the achieved fault tolerance wrt. multiple faults is performed.
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