光学MEMS用玻璃上的SOI硅

K. P. Larsen, J. T. Ravnkilde, Ole Hansen
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引用次数: 0

摘要

提出了一种利用绝缘体上硅(SOI)晶圆的深度反应离子刻蚀(DRIE)技术在玻璃上制备单晶硅(SCS)元件的新方法。这些器件通过阳极键合封装在晶圆级的玻璃-硅-玻璃(GSG)堆栈中,并且可以使用合适的聚合物在互连处进行最终密封。封装在玻璃上的MEMS在光学MEMS和敏感电容器件中具有优势。我们报告了将SOI粘接到Pyrex上的经验。通过优化器件布局和优化工艺配方,实现了均匀的DRIE浅、深刻蚀。描述了埋地氧化膜作为通孔蚀刻止点时的行为。当氧化物厚度低于1 /spl μ m时,没有观察到有害的膜屈曲或断裂,但更大、更脆弱的释放结构将需要更薄的氧化物来防止损坏。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SOI silicon on glass for optical MEMS
A newly developed fabrication method for fabrication of single crystalline Si (SCS) components on glass, utilizing Deep Reactive Ion Etching (DRIE) of a Silicon On Insulator (SOI) wafer is presented. The devices are packaged at wafer level in a glass-silicon-glass (GSG) stack by anodic bonding and a final sealing at the interconnects can be performed using a suitable polymer. Packaged MEMS on glass are advantageous within Optical MEMS and for sensitive capacitive devices. We report on experiences with bonding SOI to Pyrex. Uniform DRIE shallow and deep etching was achieved by a combination of an optimized device layout and an optimized process recipe. The behavior of the buried oxide membrane when used as an etch stop for the through-hole etch is described. No harmful buckling or fracture of the membrane is observed for an oxide thickness below 1 /spl mu/m, but larger and more fragile released structures will need a thinner oxide in order to prevent damage.
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