纳米结构器件应用的能谱和载流子统计数值分析

I. Saad, A. M. Khairul, A. R. A. Bakar, N. Bolong, T. Kenneth, V. Arora
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引用次数: 0

摘要

对纳米结构器件应用中的能谱和载流子统计进行了数值分析。成功地推导了准3D、二维和准ID系统的低维能谱,这些能谱调用了与德布罗意波长(λD = 10nm)相当的量子约束(QCE)效应。对于非简并(ND)掺杂样品,费米-狄拉克(FD)积分可以用玻尔兹曼统计量很好地近似。然而,在简并掺杂的准三维、二维和ID器件中,FD积分分别近似为1 / 2阶、0阶和- 1 / 2阶。费米能量显示为载流子浓度的弱(对数)函数,但在ND区随温度线性变化。然而,对于强简并统计量,费米能量与温度无关,是载流子浓度的强函数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Energy Spectrum and Carrier Statistics Numerical Analysis for Nanostructure Device Application
Numerical analysis of energy spectrum and carrier statistics for nanostructure device application is presented. The low-dimensional energy spectrum was successfully derived for the respective quasi 3D, 2D and ID system that invoked the effect of quantum confinement (QCE) comparable to the De Broglie wavelength (λD ≅ 10nm). For non-degenerately (ND) doped samples the Fermi-Dirac (FD) integral is well approximated by Boltzmann statistics. However, in degenerate doped quasi 3D, 2D and ID device, the FD integral is found to be approximated by order one-half, zero and minus one-half respectively. The Fermi energy is revealed to be a weak (logarithmic) function of carrier concentration, but varies linearly with temperature in the ND regime. However, for strongly degenerate statistics, the Fermi energy is independent of temperature and is a strong function of carrier concentration.
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