功率器件芯片级封装及其在集成电力电子模块中的应用

Xingsheng Liu, Xiukuan Jing, G. Lu
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引用次数: 36

摘要

提出了一种利用芯片级封装(CSP)功率器件构建三维集成电力电子模块(IPEMs)的电力电子封装技术。这种芯片级封装结构被称为Die Dimensional Ball Grid Array (D/sup 2/BGA),通过使用堆叠的焊料凸起来互连电源芯片,从而消除了明智的键合。D/sup 2/BGA封装由电源芯片、内部焊料凸起、高铅焊料球和成型树脂组成。它具有与启动电源芯片相同的横向尺寸,这使得高密度封装和模块小型化成为可能。这种封装使功率芯片能够结合出色的热传递,高电流处理能力,改进的电气特性和超低的封装。电学测试表明,D/sup 2/BGA高速绝缘栅双极晶体管(igbt)的V/sub CE/(sat)和导通电阻分别提高了20%和30%,消除了器件的线键和其他外部互连,如引线框架。本文介绍了D/sup 2/BGA封装的设计、可靠性和工艺问题,并在构建30kw半桥功率转换器模块中实现了这些芯片级封装功率器件。报告了封装器件和电源模块的电气性能和可靠性测试结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Chip-scale packaging of power devices and its application in integrated power electronics modules
We present a power electronics packaging technology utilizing chip-scale packaged (CSP) power devices to build three-dimensional integrated power electronics modules (IPEMs). The chip-scale packaging structure, termed Die Dimensional Ball Grid Array (D/sup 2/BGA), eliminates wise bonds by using stacked solder bumps to interconnect power chips. D/sup 2/BGA package consists of a power chip, inner solder bumps, high-lead solder balls, and molding resin. It has the same lateral dimensions as the starting power chip, which makes high-density packaging and module miniature possible. This package enables the power chip to combine excellent thermal transfer, high current handling capability, improved electrical characteristics, and ultra-low profile packaging. Electrical tests show that the V/sub CE/(sat) and on-resistance of the D/sup 2/BGA high speed insulated-gate-bipolar transistors (IGBTs) are improved by 20% and 30% respectively by eliminating the device's wirebonds and other external interconnections, such as the leadframe. In this paper, we present the design, reliability, and processing issues of D/sup 2/BGA package, and the implementation of these chip-scale packaged power devices in building 30 kW half-bridge power converter modules. The electrical and reliability test results of the packaged devices and the power modules are reported.
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