薄膜热电阻器辐射硬度实验结果

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629795

A. Nikiforov, V. A. Telets, V. S. Figurov

{"title":"薄膜热电阻器辐射硬度实验结果","authors":"A. Nikiforov, V. A. Telets, V. S. Figurov","doi":"10.1109/REDW.1997.629795","DOIUrl":null,"url":null,"abstract":"Radiation hardness tests of thin-film thermo-resistors were carried out in the temperature range of -60...+125/spl deg/C with 1% accuracy. The total resistance deviations from initial values did not exceed 2% after the dose rate 2.7/spl middot/10/sup 10/ rad(Si)/s, total dose 1.8/spl middot/10/sup 5/ rad(Si)/s and neutron flux 2.4/spl middot/10/sup 12/ n/cm/sup 2/ irradiation.","PeriodicalId":328522,"journal":{"name":"1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Thin-film thermo-resistor radiation hardness experimental results\",\"authors\":\"A. Nikiforov, V. A. Telets, V. S. Figurov\",\"doi\":\"10.1109/REDW.1997.629795\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Radiation hardness tests of thin-film thermo-resistors were carried out in the temperature range of -60...+125/spl deg/C with 1% accuracy. The total resistance deviations from initial values did not exceed 2% after the dose rate 2.7/spl middot/10/sup 10/ rad(Si)/s, total dose 1.8/spl middot/10/sup 5/ rad(Si)/s and neutron flux 2.4/spl middot/10/sup 12/ n/cm/sup 2/ irradiation.\",\"PeriodicalId\":328522,\"journal\":{\"name\":\"1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-07-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.1997.629795\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.1997.629795","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

在-60℃的温度范围内对薄膜热电阻器进行了辐射硬度试验。+125/spl度/C，精度为1%。辐照率为2.7/spl middot/10/sup 10/ rad(Si)/s，总剂量为1.8/spl middot/10/sup 5/ rad(Si)/s，中子通量为2.4/spl middot/10/sup 12/ n/cm/sup 2/辐照后，总电阻与初始值的偏差不超过2%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Thin-film thermo-resistor radiation hardness experimental results

Radiation hardness tests of thin-film thermo-resistors were carried out in the temperature range of -60...+125/spl deg/C with 1% accuracy. The total resistance deviations from initial values did not exceed 2% after the dose rate 2.7/spl middot/10/sup 10/ rad(Si)/s, total dose 1.8/spl middot/10/sup 5/ rad(Si)/s and neutron flux 2.4/spl middot/10/sup 12/ n/cm/sup 2/ irradiation.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

自引率

0.00%

发文量