微结构、结瘤和势垒对信号完整性影响的研究

Ting-Yu Chou, Chia-Ling Chen, Fu-Je Chen, Chin-Chen Huang, James Chen
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引用次数: 0

摘要

用于高频和高速电路的铜箔的信号传输特性取决于其表面粗糙度、微观结构和阻隔性。本文研究了在高频电路应用中,铜箔制造工艺对印刷电路板(PCB)插入损耗的影响。为了满足高频高速预浸料日益增长的耐热性要求,本研究还提出了一种新的屏障设计。实验结果表明,采用一种新的表面处理技术制备的超低粗糙度铜箔(VH0箔)具有良好的附着强度,相当于高粗糙度铜箔(TLC-V1箔),并且具有优异的耐热性。此外,由于该工艺具有极低的粗糙度、较少的晶体缺陷和良好的导体线导电性,因此在10 GHz频段内插入损耗低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Study of the Influence of Microstructure, Nodulation and Barrier on Signal Integrity
The signal transmission characteristics of copper foil used in high-frequency and high-speed circuits depend on its surface roughness, microstructure and barrier. This study presents the influence of copper foil manufacturing process on the insertion loss of printed circuit board (PCB) in high-frequency circuit applications. In order to meet the increasing heat resistance requirement of high-frequency and high-speed prepregs, a new barrier design is also presented in this study. Experimental results indicated that a new surface treatment technique used in the preparation of a ultra-low roughness copper foil (VH0 foil) with good adhesion strength, equivalent to high roughness copper foil (TLC-V1 foil), and excellent heat resistance. In addition, low insertion loss over 10 GHz band due to this ultra-low roughness, less crystalline defects and good conductivity of conductor line was also demonstrated by this new processing technique.
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